Dr. Bart Buijsse
at Koninklijke Philips NV
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 October 2016 Presentation + Paper
Proceedings Volume 9967, 99671A (2016) https://doi.org/10.1117/12.2235993
KEYWORDS: X-rays, Tomography, Signal to noise ratio, Scanning electron microscopy, Electron beams, Nanowires, X-ray imaging, Sensors, X-ray detectors, Spatial resolution

Proceedings Article | 6 December 2001 Paper
Proceedings Volume 4502, (2001) https://doi.org/10.1117/12.449865
KEYWORDS: X-ray sources, X-ray optics, Alternate lighting of surfaces, Roentgenium, X-rays, Electron beams, Oxygen, Photonic microstructures, X-ray microscopy, Microscopy

Proceedings Article | 18 September 1995 Paper
Eloy Wouters, L. D. Siebbeles, Bart Buijsse, W. van der Zande
Proceedings Volume 2548, (1995) https://doi.org/10.1117/12.220871
KEYWORDS: Anisotropy, Molecules, Sensors, Polarization, Hydrogen, Molecular lasers, Luminescence, Molecular beams, Doppler effect, Fabry–Perot interferometers

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