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Benjamin Vial
at Institut Fresnel
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Publications (1)
Proceedings Article | 5 October 2011 Paper
Resonances determination in microstructured films embedded in multilayered stacks
Proceedings Volume 8168, 816822 (2011) https://doi.org/10.1117/12.897347
KEYWORDS: Finite element methods, Diffraction gratings, Diffraction, Transmittance, Multilayers, Dielectrics, Silica, Dielectric polarization, Polarization, Americium
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