Dr. Benjawan Kjornrattanawanich Profile

Dr. Benjawan Kjornrattanawanich

at Brookhaven National Lab

SPIE Involvement:

Author

Publications (18)

SPIE Journal Paper | 7 March 2012 Open Access

Open Access

Long-term stability of Mg/SiC multilayers

Maria-Guglielmina Pelizzo, Alain Jody Corso, Paola Zuppella, Piergiorgio Nicolosi, Silvano Fineschi, John Seely, Benjawan Kjornrattanawanich, David Windt

OE, Vol. 51, Issue 02, 023801, (March 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.2.023801

KEYWORDS: Silicon carbide, Magnesium, Reflectivity, Multilayers, Silicon, Extreme ultraviolet, Mirrors, Visible radiation, Space telescopes, Telescopes

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Proceedings Article | 23 September 2009 Paper

Paper

Calibration of a zone plate for an EUV solar irradiance monitor

John Seely, Glenn Holland, Michael Kowalski, Benjawan Kjornrattanawanich, James Bremer, Yan Feng

Proceedings Volume 7438, 743811 (2009) https://doi.org/10.1117/12.826038

KEYWORDS: Molybdenum, Zone plates, Extreme ultraviolet, Calibration, Photodiodes, Monochromators, Sensors, Silicon, Imaging systems, Transmittance

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Proceedings Article | 18 May 2007 Paper

Paper

Multilayers for next-generation x-ray sources

S. Bajt, H. Chapman, E. Spiller, S. Hau-Riege, J. Alameda, A. Nelson, C. Walton, B. Kjornrattanawanich, A. Aquila, F. Dollar, E. Gullikson, C. Tarrio, S. Grantham

Proceedings Volume 6586, 65860J (2007) https://doi.org/10.1117/12.724786

KEYWORDS: Reflectivity, Mirrors, Multilayers, Free electron lasers, Silicon, X-ray optics, X-rays, X-ray sources, Coating, Optical components

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Proceedings Article | 15 September 2006 Paper

Paper

Determination of the optical constants of amorphous carbon in the EUV spectral region 40-450 eV

Yu. Uspenskii, J. Seely, B. Kjornrattanawanich, D. Windt, Ye. Bugayev, V. Kondratenko, I. Artyukov, A. Titov, E. Kulatov, A. Vinogradov

Proceedings Volume 6317, 631713 (2006) https://doi.org/10.1117/12.683878

KEYWORDS: Carbon, Extreme ultraviolet, Absorption, Graphene, Transmittance, Reflectivity, X-ray optics, Multilayers, Diamond, Dielectrics

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Proceedings Article | 29 August 2006 Paper

Paper

Coated photodiode technique for the determination of the optical constants of reactive elements: La and Tb

John Seely, Yurii Uspenskii, Benjawan Kjornrattanawanich, David Windt

Proceedings Volume 6317, 63170T (2006) https://doi.org/10.1117/12.683234

KEYWORDS: Reflectivity, Photodiodes, Lanthanum, Terbium, Optical components, Multilayers, Transmittance, Silicon, Optical coatings, Oxidation

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Proceedings Article | 29 August 2006 Paper

Paper

Measurement of zone plate efficiencies in the extreme ultraviolet and applications to radiation monitors for absolute spectral emission

John Seely, Glenn Holland, James Bremer, Tim Zukowski, Michael Feser, Yan Feng, Benjawan Kjornrattanawanich, Leonid Goray

Proceedings Volume 6317, 63170N (2006) https://doi.org/10.1117/12.678142

KEYWORDS: Sensors, Extreme ultraviolet, Zone plates, Diffraction, Visible radiation, Silicon, Gold, Signal detection, Solar radiation, Transmittance

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The diffraction efficiencies of a Fresnel zone plate (ZP), fabricated by Xradia Inc. using the electron-beam writing technique, were measured using polarized, monochromatic synchrotron radiation in the extreme ultraviolet wavelength range 3.4-22 nm. The ZP had 2 mm diameter, 3330 zones, 150 nm outer zone width, and a 1 mm central occulter. The ZP was supported by a 100 nm thick Si₃N₄ membrane. The diffraction patterns were recorded by CMOS imagers with phosphor coatings and with 5.2 μm or 48 μm pixels. The focused +n orders (n=1-4), the diverging -1 order, and the undiffracted 0 order were observed as functions of wavelength and off-axis tilt angle. Sub-pixel focusing of the +n orders was achieved. The measured efficiency in the +1 order was in the 5% to 30% range with the phase-shift enhanced efficiency occurring at 8.3 nm where the gold bars are partially transmitting. The +2 and higher order efficiencies were much lower than the +1 order efficiency. The efficiencies were constant when the zone plate was tilted by angles up to ±1° from the incident radiation beam. This work indicates the feasibility and benefits of using zone plates to measure the absolute EUV spectral emissions from solar and laboratory sources: relatively high EUV efficiency in the focused +1 order, good out-of-band rejection resulting from the low higher-order efficiencies and the ZP focusing properties, insensitivity to (unfocused) visible light scattered by the ZP, flat response with off-axis angle, and insensitivity to the polarization of the radiation based on the ZP circular symmetry. EUV sensors with Fresnel zone plates potentially have many advantages over existing sensors intended to accurately measure absolute EUV emission levels, such as those implemented on the GOES N-P satellites that use transmission gratings which have off-axis sensitivity variations and poor out-of-band EUV and visible light rejection, and other solar and laboratory sensors using reflection gratings which are subject to response variations caused by surface contamination and oxidation.

Proceedings Article | 29 August 2006 Paper

Paper

Optical constants determination of neodymium and gadolinium in the 3- to 100-nm wavelength range

B. Kjornrattanawanich, D. Windt, Y. Uspenskii, J. Seely

Proceedings Volume 6317, 63170U (2006) https://doi.org/10.1117/12.681952

KEYWORDS: Neodymium, Gadolinium, Silicon, Reflectivity, Multilayers, Transmittance, Photodiodes, Coating, Refraction, Optical testing

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Proceedings Article | 15 September 2005 Paper

Paper

Development and testing of EUV multilayer coatings for the atmospheric imaging assembly instrument aboard the Solar Dynamics Observatory

Regina Soufli, David Windt, Jeffrey Robinson, Sherry Baker, Eberhard Spiller, Franklin Dollar, Andrew Aquila, Eric Gullikson, Benjawan Kjornrattanawanich, John Seely, Leon Golub

Proceedings Volume 5901, 59010M (2005) https://doi.org/10.1117/12.617370

KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Molybdenum, Mirrors, Silicon, Iron, Telescopes, Observatories, Optical coatings

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Proceedings Article | 15 September 2005 Paper

Paper

Silicon carbide photodiodes: future solar-blind EUV/soft x-ray detectors

J. Seely, Benjawan Kjornrattanawanich, Raj Korde

Proceedings Volume 5901, 59010B (2005) https://doi.org/10.1117/12.619327

KEYWORDS: Silicon carbide, Photodiodes, Extreme ultraviolet, Silicon, Visible radiation, X-ray detectors, X-rays, Sensors, Absorption, Optical testing

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Proceedings Article | 14 September 2005 Paper

Paper

Extreme UV optical constants of rare-earth metals free from effects of air contamination

Yu. Uspenski, J. Seely, N. Popov, I. Artioukov, A. Vinogradov, D. Windt, B. Kjornrattanawanich

Proceedings Volume 5919, 59190S (2005) https://doi.org/10.1117/12.620042

KEYWORDS: Absorption, Metals, Extreme ultraviolet, Lanthanum, Terbium, Air contamination, Photodiodes, Silicon, Reflectivity, Silicon films

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Proceedings Article | 8 September 2005 Paper

Paper

Narrow-band EUV multilayer coating for the MOSES sounding rocket

Scott Owens, Jeffery Gum, Charles Tarrio, Steven Grantham, Joseph Dvorak, Benjawan Kjornrattanawanich, Ritva Keski-Kuha, Roger Thomas, Charles Kankelborg

Proceedings Volume 5900, 590003 (2005) https://doi.org/10.1117/12.617520

KEYWORDS: Coating, Reflectivity, Extreme ultraviolet, Multilayers, Silicon, Reflection, Iron, Spectrographs, Rockets, Optical design

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Proceedings Article | 1 September 2005 Paper

Paper

Off-plane grazing-incidence Constellation-X grating calibrations using polarized synchrotron radiation and PCGRATE code calculations

J. Seely, L. Goray, Benjawan Kjornrattanawanich, J. Laming, G. Holland, K. Flanagan, R. Heilmann, C.-H. Chang, M. Schattenburg, A. Rasmussen

Proceedings Volume 5900, 59000B (2005) https://doi.org/10.1117/12.615943

KEYWORDS: Diffraction gratings, Polarization, Photodiodes, Diffraction, Calibration, Synchrotron radiation, X-rays, Synchrotrons, Spectroscopy, Imaging systems

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Proceedings Article | 14 October 2004 Paper

Paper

Extreme ultraviolet optical constants for the design and fabrication of multilayer-coated gratings

John Seely, Leonid Goray, David Windt, Benjawan Kjornrattanawanich, Yurii Uspenskii, Alexander Vinogradov

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.559053

KEYWORDS: Multilayers, Reflectivity, Optical coatings, Silicon, Extreme ultraviolet, Mirrors, Molybdenum, Optical design, Diffraction gratings, Beryllium

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Proceedings Article | 14 October 2004 Paper

Paper

An assessment of yttrium optical constants EUV using Mo/Y multilayers designed as in the linear polarizers

Benjawan Kjornrattanawanich, Regina Soufli, Sasa Bajt, David Windt, John Seely

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.560465

KEYWORDS: Multilayers, Polarization, Yttrium, Reflectivity, Transmittance, Extreme ultraviolet, Linear polarizers, Wave plates, Photodiodes, Molybdenum

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Proceedings Article | 15 September 2004 Paper

Paper

GOES solar EUV detector calibration at the NSLS

John Wise, Geoffrey Gaines, Arthur Gaudet, Mark Gummin, Fred Hanser, Allen Harris, Stephen Hersey, Benjawan Kjornrattanawanich

Proceedings Volume 5549, (2004) https://doi.org/10.1117/12.559986

KEYWORDS: Extreme ultraviolet, Photodiodes, Calibration, Sensors, Data modeling, Prototyping, Solar energy, Visible radiation, Error analysis, Diffraction gratings

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Proceedings Article | 29 January 2004 Paper

Paper

Multilayer-coated photodiodes with polarization sensitivity at EUV wavelength

Benjawan Kjornrattanawanich, Sasa Bajt, John Seely

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.507115

KEYWORDS: Multilayers, Photodiodes, Polarization, Reflectivity, Transmittance, Extreme ultraviolet, Coating, Silicon, Molybdenum, Polarizers

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Proceedings Article | 29 January 2004 Paper

Paper

EUV multilayers for solar physics

David Windt, S. Donguy, John Seely, Benjawan Kjornrattanawanich, Eric Gullikson, C. C. Walton, L. Golub, E. DeLuca

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.506175

KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Iron, X-rays, Silicon, Optical coatings, Absorption, Solar processes, EUV optics

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Proceedings Article | 29 January 2004 Paper

Paper

Performance of multilayer-coated gratings for the extreme-ultraviolet imaging spectrometer (EIS) for the Solar-B mission

John Seely, David Windt, Soizik Donguy, Charles Brown, Glenn Holland, William Hunter, Michael Kowalski, Benjawan Kjornrattanawanich, George Doschek, John Mariska, Clarence Korendyke, Ken Dere

Proceedings Volume 5168, (2004) https://doi.org/10.1117/12.507160

KEYWORDS: Mirrors, Multilayers, Reflectivity, Lithium, Spectroscopy, Electrophoretic light scattering, Extreme ultraviolet, Diffraction gratings, Optical coatings, Sensors

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Showing 5 of 18 publications

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