Dr. Bincheng Li Profile

Dr. Bincheng Li

Research Professor at Institute of Optics and Electronics CAS

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Author

Publications (21)

Proceedings Article | 13 December 2021 Paper

Characterization of Kepler structured microlens array scanners for 2D scanning

Xu Yang, Chao Geng, Xiaoyang Li, Bincheng Li, Xinyang Li

Proceedings Volume 12074, 120740M (2021) https://doi.org/10.1117/12.2603968

KEYWORDS: Microlens array, Scanners, Optical simulations, Optical communications, Lenses, Analytical research, Adaptive optics

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Proceedings Article | 13 December 2021 Paper

Interference pattern with an analytical solution in modified Shack-Hartmann sensor

Xiaoyang Li, Xu Yang, Bincheng Li, Shengqian Wang, Hao Xian

Proceedings Volume 12070, 120700F (2021) https://doi.org/10.1117/12.2603971

KEYWORDS: Mirrors, Segmented mirrors, Fourier transforms, Sensors, Telescopes, Wavefront sensors, Mathematical modeling, Imaging systems, Adaptive optics

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Proceedings Article | 30 January 2019 Paper

Gas flow simulation research on reaction chamber of reactive ion etching

Jingwen Zhang, Fan Bin, Zhiwei Li, Xin Liu, Bincheng Li, Han Yu, Gong Chang

Proceedings Volume 10841, 108410G (2019) https://doi.org/10.1117/12.2512222

KEYWORDS: Reactive ion etching, Electrodes, Etching, 3D modeling, Plasma, Electronics, Plasma etching, Manufacturing, Protactinium, Lithium

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SPIE Journal Paper | 9 April 2018

NiCrNx interlayer thickness dependence of spectral performance and environmental durability of protected-silver mirrors

Xu Xu, Bincheng Li, Wenyan He, Changjun Wang, Ming Wei

OE, Vol. 57, Issue 04, 045101, (April 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.4.045101

KEYWORDS: Mirrors, Silver, Reflectivity, Humidity, Corrosion, Fiber optic gyroscopes, Scattering, Transmittance, Resistance, Scanning electron microscopy

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Proceedings Article | 23 November 2015 Paper

Transmittance measurements of laser components using a combination of cavity ring-down and photometry

H. Cui, Y. Han, C. Gao, Y. Wang, B. Li

Proceedings Volume 9632, 96321P (2015) https://doi.org/10.1117/12.2197779

KEYWORDS: Transmittance, Photometry, Spectrophotometry, Laser components, Laser optics, Mirrors, Fabrication, Reflectivity, Light sources, Continuous wave operation

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Proceedings Article | 12 January 2012 Paper

Measurement of losses in optical components using filtered optical feedback cavity ring down technique

Zhechao Qu, Bincheng Li, Yanling Han

Proceedings Volume 8206, 82061M (2012) https://doi.org/10.1117/12.910454

KEYWORDS: Optical components, Mirrors, Semiconductor lasers, Optical testing, Scattering, Absorption, Laser scattering, Optical filters, Electronic filtering, Reflectivity

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Proceedings Article | 28 November 2011 Paper

Reflectivity measurement with optical feedback cavity ring-down technique employing a multi-longitudinal-mode diode laser

Zhechao Qu, Yanling Han, Shengming Xiong, Bincheng Li

Proceedings Volume 8190, 81901C (2011) https://doi.org/10.1117/12.905371

KEYWORDS: Reflectivity, Semiconductor lasers, Mirrors, Signal detection, Modulation, Continuous wave operation, Optical filters, Spectroscopy, Optical testing, Ferroelectric materials

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Proceedings Article | 20 May 2009 Paper

Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down technique

Yuan Gong, Yanling Han, Bincheng Li

Proceedings Volume 7283, 72830U (2009) https://doi.org/10.1117/12.828618

KEYWORDS: Reflectivity, Semiconductor lasers, Mirrors, Modulation, Optical testing, Signal detection, Light sources, Oscillators, Absorption spectroscopy, Continuous wave operation

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Proceedings Article | 30 December 2008 Paper

Accurate high reflectivity measurement based on a novel optical feedback cavity ring-down technique

Yuan Gong, Bincheng Li, Yanling Han, Mingqiang Liu

Proceedings Volume 7132, 71320U (2008) https://doi.org/10.1117/12.804178

KEYWORDS: Reflectivity, Mirrors, Semiconductor lasers, Signal detection, Laser development, Switching, Oscillators, Laser damage threshold, Laser stabilization, Time metrology

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Proceedings Article | 30 December 2008 Paper

Measuring surface deformation of optical components with surface thermal lens technique

Mingqiang Liu, Bincheng Li, Yanru Wang, Honggang Hao

Proceedings Volume 7132, 71320T (2008) https://doi.org/10.1117/12.804175

KEYWORDS: Modulation, Optical components, Laser beam diagnostics, Data modeling, Optical coatings, Laser systems engineering, Solids, Laser irradiation, Thermal modeling, Mirrors

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Proceedings Article | 20 December 2007 Paper

Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement

Yuan Gong, Bincheng Li

Proceedings Volume 6720, 67201E (2007) https://doi.org/10.1117/12.758948

KEYWORDS: Reflectivity, Sensors, Mirrors, Signal detection, Semiconductor lasers, Continuous wave operation, Performance modeling, Oscilloscopes, Instrument modeling, Absorption

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Proceedings Article | 20 December 2007 Paper

Photothermal detuning: a sensitive technique for absorption measurement of optical thin films

Honggang Hao, Bincheng Li, Mingqiang Liu, Yuan Gong

Proceedings Volume 6720, 67201D (2007) https://doi.org/10.1117/12.758949

KEYWORDS: Coating, Absorption, Reflectivity, Laser beam diagnostics, Optical coatings, Modulation, Optical testing, Reflection, Refractive index, Temperature metrology

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Proceedings Article | 28 November 2007 Paper

Comparison of signals under top-hat and Gaussian beam excitations in surface thermal lens technique

Mingqiang Liu, Bincheng Li, Honggang Hao

Proceedings Volume 6834, 68342D (2007) https://doi.org/10.1117/12.755718

KEYWORDS: Gaussian beams, Modulation, Laser beam diagnostics, Optical coatings, Numerical simulations, Optical testing, Thermography, Optical components, Continuous wave operation

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Proceedings Article | 27 November 2007 Paper

Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement

Yuan Gong, Bincheng Li

Proceedings Volume 6723, 672356 (2007) https://doi.org/10.1117/12.783744

KEYWORDS: Reflectivity, Semiconductor lasers, Mirrors, Continuous wave operation, Modulation, Detection theory, Phase shifts, Laser applications, Signal detection, Laser damage threshold

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Proceedings Article | 5 October 2005 Paper

High reflectivity measurement with cavity ring-down technique

Li-feng Gao, Sheng-ming Xiong, Bin-cheng Li, Yong-dong Zhang

Proceedings Volume 5963, 59632F (2005) https://doi.org/10.1117/12.627774

KEYWORDS: Reflectivity, Mirrors, Sensors, Spectroscopy, Absorption, Oscilloscopes, Optical parametric oscillators, Error analysis, Diagnostics, Molecules

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Proceedings Article | 12 April 2001 Paper

Different conditioning and absorption behavior of fluoride material combinations for dielectric multilayers at 193 nm

Bincheng Li, S. Martin, Eberhard Welsch

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425059

KEYWORDS: Absorption, Multilayers, Magnesium fluoride, Dielectrics, Mirrors, Laser irradiation, Optical coatings, Pulsed laser operation, Calibration, Reflectivity

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Proceedings Article | 3 March 2000 Paper

Thickness dependence of damage thresholds for 193-nm dielectric mirrors by predamage sensitive photothermal technique

Holger Blaschke, Winfried Arens, Detlev Ristau, Sven Martin, Bincheng Li, Eberhard Welsch

Proceedings Volume 3902, (2000) https://doi.org/10.1117/12.379306

KEYWORDS: Absorption, Laser damage threshold, Laser induced damage, Oxides, Optical coatings, Multilayers, Lithium, Ultraviolet radiation, Reflectivity, Dielectric mirrors

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Proceedings Article | 3 March 2000 Paper

Thermoelastic influence of substrate on damage threshold of ultraviolet dielectric coatings

Bincheng Li, Sven Martin, Eberhard Welsch

Proceedings Volume 3902, (2000) https://doi.org/10.1117/12.379307

KEYWORDS: Copper, Optical coatings, Dielectrics, Quartz, Laser damage threshold, Absorption, Ultraviolet radiation, Reflectivity, Diffusion, Laser induced damage

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Proceedings Article | 3 March 2000 Paper

Pulsed top-hat beam thermal lens: a simple and sensitive tool for in-situ measurement on ultraviolet dielectric components

Bincheng Li, Sven Martin, Eberhard Welsch, Roland Thielsch, Joerg Heber, Norbert Kaiser

Proceedings Volume 3902, (2000) https://doi.org/10.1117/12.379313

KEYWORDS: Dielectrics, Absorption, Optical coatings, Ultraviolet radiation, Excimer lasers, Laser induced damage, Laser beam diagnostics, In situ metrology, Laser irradiation, Copper

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Proceedings Article | 7 April 1999 Paper

Configuration optimization and sensitivity comparison among thermal lens, photothermal deflection, and interference detection techniques

Bincheng Li, Eberhard Welsch

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344458

KEYWORDS: Laser beam diagnostics, Optical coatings, Phase shifts, Absorption, Signal detection, Laser induced damage, Refractive index, Thermography, Optical testing, Near field

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Proceedings Article | 7 April 1999 Paper

Influence of thermal substrate properties on the damage threshold of UV coatings

Holger Blaschke, Sven Martin, Andreas Morak, Ch. Koenigsdoerffer, M. Roth, Bincheng Li, Eberhard Welsch, Roland Thielsch, Norbert Kaiser

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344387

KEYWORDS: Laser damage threshold, Copper, Aluminum, Quartz, Thermal effects, Temperature metrology, Optical coatings, Ultraviolet coatings, Thin films, Pulsed laser operation

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Showing 5 of 21 publications

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