Binjian Xin
at Univ Karlsruhe
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 1 July 2009
OE, Vol. 48, Issue 07, 073602, (July 2009) https://doi.org/10.1117/12.10.1117/1.3158991
KEYWORDS: Signal to noise ratio, Fractal analysis, Wavelets, Optical testing, 3D modeling, Radon transform, Optical engineering, Wavelet transforms, Metrology, Data acquisition

Proceedings Article | 17 February 2007 Paper
Proceedings Volume 6503, 65030D (2007) https://doi.org/10.1117/12.698505
KEYWORDS: Digital filtering, Image filtering, Interferometers, Metrology, Sensors, Image segmentation, Fourier transforms, Data acquisition, 3D image processing, Inspection

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