Dr. Bohua Yin Profile

Dr. Bohua Yin

at Institute of Electrical Engineering

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Publications (4)

Proceedings Article | 20 September 2024 Paper

Adaptive micro-area x-ray spectroscopy peak finding based on symmetric zero-area method

Yuhan Fang, Bohua Yin, Zhengjie Li, Li Han

Proceedings Volume 13269, 132690H (2024) https://doi.org/10.1117/12.3045753

KEYWORDS: Spectroscopy, X-rays, Chemical elements, Windows, Tunable filters, Detection and tracking algorithms, Optical filters, Zinc, Silver, Silicon

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Proceedings Article | 10 September 2022 Paper

Research on constant area spectral peak reconstruction algorithm for improving energy resolution of silicon drift detectors

Longjun Cheng, Bohua Yin, Mingzhang Chu, Zhengjie Li, Botong Sun, Dazheng Wang, Junbiao Liu, Li Han

Proceedings Volume 12328, 123280Q (2022) https://doi.org/10.1117/12.2644190

KEYWORDS: X-rays, Silicon, Reconstruction algorithms, Sensors, Spectral resolution, Quantization, Mathematical modeling, Manganese, Zirconium, Scanning electron microscopy

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Proceedings Article | 24 January 2019 Paper

Study of the linewidth measurement with scanning electron microscope based on laser interference principle

Bohua Yin, Mingzhang Chu, Guanglu Xu, Xue Li, Junbiao Liu, Daixie Chen, Han Li, Chao Jiang, Xiaoyong Cai

Proceedings Volume 10840, 108400U (2019) https://doi.org/10.1117/12.2505766

KEYWORDS: Scanning electron microscopy, Metrology, Digital signal processing, Interferometers, Electron microscopes, Image processing, Semiconductors, Image resolution, Raster graphics, Calibration

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Proceedings Article | 25 October 2016 Paper

X-ray microscopy using reflection targets based on SEM with tungsten filament

Junbiao Liu, Yutian Ma, Weixia Zhao, Geng Niu, Mingzhang Chu, Bohua Yin, Li Han, Baodong Liu

Proceedings Volume 9685, 96850I (2016) https://doi.org/10.1117/12.2241728

KEYWORDS: X-ray microscopy, Scanning electron microscopy, Tungsten, X-ray imaging, X-rays, Electron beams, Sensors, X-ray detectors, Signal attenuation, Beryllium

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