Dr. Boris Vandewalle
at imec
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 March 2015 Paper
W. Gillijns, S. M. Y. Sherazi, D. Trivkovic, B. Chava, B. Vandewalle, V. Gerousis, P. Raghavan, J. Ryckaert, K. Mercha, D. Verkest, G. McIntyre, K. Ronse
Proceedings Volume 9427, 942709 (2015) https://doi.org/10.1117/12.2085923
KEYWORDS: Metals, Photomasks, Semiconducting wafers, Lithography, Optical lithography, Standards development, Capacitance, Optical proximity correction, Scanning electron microscopy, Manufacturing

Proceedings Article | 28 March 2014 Paper
Proceedings Volume 9053, 90530Q (2014) https://doi.org/10.1117/12.2048079
KEYWORDS: Metals, Extreme ultraviolet lithography, Optical lithography, Etching, Extreme ultraviolet, Argon, Logic, Lithography, Computational lithography, Double patterning technology

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