Richard Brad Brumfield
Manager, Advanced Programs at Sig Sauer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 December 2003 Paper
Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.505854
KEYWORDS: Wavefronts, Sensors, Contact lenses, Interferometers, Calibration, Ray tracing, Interferometry, Optical testing, Monochromatic aberrations, Metrology

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