Dr. Christian Moormann
General Manager at AMO GmbH
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 1 May 2014 Paper
Martin Rumpel, Benjamin Dannecker, Andreas Voss, Michael Möller, Christian Moormann, Thomas Graf, Marwan Abdou Ahmed
Proceedings Volume 9135, 913519 (2014) https://doi.org/10.1117/12.2053885
KEYWORDS: Waveguides, Mirrors, Reflectivity, Polarization, Silica, Optical design, Reflectors, Laser resonators, Absorption, Laser damage threshold

Proceedings Article | 28 March 2014 Paper
Manuel Thesen, Maximilian Rumler, Florian Schlachter, Susanne Grützner, Christian Moormann, Mathias Rommel, Dieter Nees, Stephan Ruttloff, Stefan Pfirrmann, Marko Vogler, Arne Schleunitz, Gabi Grützner
Proceedings Volume 9049, 90490H (2014) https://doi.org/10.1117/12.2046279
KEYWORDS: Nanoimprint lithography, Etching, Dry etching, Silicon, Photoresist processing, Positron emission tomography, Surface roughness, Semiconducting wafers, Nanostructures, Refractive index

Proceedings Article | 25 October 2013 Paper
Fritjof Büttner, Jan Hagemann, Mike Wellhausen, Sebastian Funke, Christoph Lenth, Frank Rotter, Lars Gundrum, Ulrich Plachetka, Christian Moormann, Moritz Strube, Andreas Walte, Hainer Wackerbarth
Proceedings Volume 8896, 889609 (2013) https://doi.org/10.1117/12.2028736
KEYWORDS: Surface enhanced Raman spectroscopy, Spectroscopy, Explosives, Molecules, Raman spectroscopy, Principal component analysis, Chemical analysis, Plasmonics, Explosives detection, Gold

Proceedings Article | 15 May 2008 Paper
Kristian Baumann, Nikolaj Moll, Thilo Stöferle, Thorsten Wahlbrink, Jens Bolten, Thomas Mollenhauer, Christian Moormann, Baoling Wang, Ulli Scherf, Rainer Mahrt
Proceedings Volume 6999, 699906 (2008) https://doi.org/10.1117/12.782990
KEYWORDS: Photonic crystals, Laser crystals, Mirrors, Laser damage threshold, Thin films, Mirror structures, Finite-difference time-domain method, Polymers, Picosecond phenomena, Analytical research

Proceedings Article | 1 May 2008 Paper
Proceedings Volume 6996, 69960A (2008) https://doi.org/10.1117/12.780176
KEYWORDS: Silicon, Resonators, Waveguides, Etching, Photonic devices, Lithography, Optical design, Modulators, Reactive ion etching, Refractive index

Showing 5 of 6 publications
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