Dr. Christine E. Heckle
Manager at Corning Incorporated
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 12 May 2005 Paper
Proceedings Volume 5754, (2005) https://doi.org/10.1117/12.598741
KEYWORDS: Birefringence, Polarization, Silica, Glasses, Anisotropy, Data modeling, Laser induced damage, Excimer lasers, Wavefronts, Adaptive optics

Proceedings Article | 16 June 2003 Paper
Kenneth Hrdina, Bradford Ackerman, Andrew Fanning, Christine Heckle, David Jenne, W. Navan
Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.484925
KEYWORDS: Glasses, Ultrasonics, Metrology, Interferometers, Photomasks, Interferometry, Extreme ultraviolet lithography, Spatial resolution, Refraction, Optical components

Proceedings Article | 27 December 2002 Paper
Proceedings Volume 4889, (2002) https://doi.org/10.1117/12.467778
KEYWORDS: Glasses, Extreme ultraviolet lithography, Extreme ultraviolet, Photomasks, Inspection, Silica, Metrology, Polarimetry, Titanium, Transmission electron microscopy

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