Mr. Christopher J. Ditchman Profile

Christopher J. Ditchman

Optical Engineer at Rochester Precision Optics LLC

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Author

Publications (5)

Proceedings Article | 18 December 2012 Paper

The design of a multi-point probe for a scanning low-coherence distance-measuring interferometer

Christopher Cotton, Christopher Ditchman, Nathan Burdick, Damon Diehl

Proceedings Volume 8550, 85500W (2012) https://doi.org/10.1117/12.980928

KEYWORDS: Prisms, Polarization, Interferometers, Beam splitters, Optical testing, Prototyping, Freeform optics, Optical design, Refractive index, 3D modeling

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Proceedings Article | 21 May 2011 Paper

Advances in freeform optical metrology using a multibeam low-coherence optical probe (Quad-Probe)

Christopher Ditchman, Damon Diehl, Christopher Cotton, Nathan Burdick, David Woodlock, Jun Zou

Proceedings Volume 8016, 80160V (2011) https://doi.org/10.1117/12.883933

KEYWORDS: 3D modeling, Freeform optics, Refraction, Surface finishing, Metrology, Scanners, Optical testing, Beam splitters, Interfaces, Optical spheres

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Proceedings Article | 28 April 2009 Paper

Low-coherence surface metrology using a multiple-beam optical probe

Damon Diehl, Christopher Ditchman, Christopher Cotton

Proceedings Volume 7302, 73020T (2009) https://doi.org/10.1117/12.818611

KEYWORDS: Interferometers, 3D modeling, Metrology, Domes, Optical testing, Beam splitters, Scanners, Photoresist materials, Freeform optics, Glasses

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Proceedings Article | 14 May 2007 Paper

Surface and thickness metrology using scanning low-coherence dual interferometry (SLCDI)

Christopher Ditchman, Christopher Cotton, Damon Diehl

Proceedings Volume 10316, 103161Z (2007) https://doi.org/10.1117/12.718724

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Proceedings Article | 2 May 2007 Paper

Transmitted wavefront metrology of hemispheric domes using scanning low-coherence dual-interferometry (SLCDI)

Damon Diehl, Christopher Cotton, Christopher Ditchman, Bryan Statt

Proceedings Volume 6545, 65450N (2007) https://doi.org/10.1117/12.718737

KEYWORDS: Interferometers, Domes, Wavefronts, Interferometry, Optical testing, Wavefront metrology, Optical coherence tomography, Missiles, Coherence (optics), Monochromatic aberrations

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