Mr. Christopher H. Freund Profile

Christopher H. Freund

at National Measurement Institute of Australia

SPIE Involvement:

Author

Publications (6)

SPIE Journal Paper | 2 March 2012 Open Access

Metrological scanning probe microscope based on a quartz tuning fork detector

Bakir Babic, Chris Freund, Jan Herrmann, Malcolm Lawn, John Miles

JM3, Vol. 11, Issue 1, 011003, (March 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.1.011003

KEYWORDS: Metrology, Sensors, Atomic force microscopy, Scanning probe microscopes, Quartz, Frequency modulation, Scanning probe microscopy, Fermium, Mirrors, Interferometers

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 1 June 2011 Paper

A metrological scanning probe microscope based on a quartz tuning fork detector

Bakir Babic, Christopher Freund, Malcolm Lawn, John Miles, Jan Herrmann

Proceedings Volume 8036, 80360P (2011) https://doi.org/10.1117/12.884567

KEYWORDS: Metrology, Sensors, Scanning probe microscopy, Atomic force microscopy, Quartz, Scanning probe microscopes, Interferometers, Mirrors, Actuators, Standards development

Read Abstract +

Proceedings Article | 3 June 2010 Paper

Traceable nanoscale length metrology using a metrological Scanning Probe Microscope

Malcolm Lawn, Jan Herrmann, Christopher Freund, John Miles, Malcolm Gray, Daniel Shaddock, Victoria Coleman, Asa Jämting

Proceedings Volume 7729, 77290L (2010) https://doi.org/10.1117/12.853788

KEYWORDS: Metrology, Interferometers, Mirrors, Scanning probe microscopy, Interferometry, Scanning probe microscopes, Oscillators, Heterodyning, Laser interferometry, Standards development

Read Abstract +

Proceedings Article | 11 November 1999 Paper

Characterization of wavefront variations in coated optics

Bozenko Oreb, Roger Netterfield, Christopher Walsh, Christopher Freund, Achim Leistner, Jeffrey Seckold

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369189

KEYWORDS: Wavefronts, Antireflective coatings, Monochromatic aberrations, Distortion, Optical coatings, LIGO, Interferometers, Reflectivity, Reflection, Nanoimprint lithography

Read Abstract +

Proceedings Article | 7 September 1999 Paper

Coating requirements for the reference flat of a Fizeau interferometer used for measuring from uncoated to highly reflecting surfaces

Roger Netterfield, David Drage, Christopher Freund, Christopher Walsh, Achim Leistner, Jeffrey Seckold, Bozenko Oreb

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360073

KEYWORDS: Coating, Fizeau interferometers, Reflectivity, Reflection, Critical dimension metrology, Fringe analysis, Surface finishing, LIGO, Interfaces, Silica

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years