Dr. Christos F. Karanikas
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 27 March 2014 Paper
Christos Karanikas, J. Taylor, Naveen Vaduri, Tafsirul Islam
Proceedings Volume 9051, 90511L (2014) https://doi.org/10.1117/12.2045908
KEYWORDS: Photoresist processing, Logic, Semiconducting wafers, Lithography, Image processing, Optical lithography, Critical dimension metrology, Line edge roughness, Diffractive optical elements, Etching

Proceedings Article | 29 March 2013 Paper
Proceedings Volume 8682, 86820O (2013) https://doi.org/10.1117/12.2012331
KEYWORDS: Diffusion, Critical dimension metrology, Polymers, Photoresist processing, Image processing, Manufacturing, Lithography, Optical lithography, Data modeling, Modulation

Proceedings Article | 29 March 2013 Paper
Christos Karanikas, Jeong Soo Kim
Proceedings Volume 8682, 868227 (2013) https://doi.org/10.1117/12.2011209
KEYWORDS: Scanning laser ophthalmoscopy, Photoresist processing, Metals, Interfaces, Ions, Critical dimension metrology, Silicon, Semiconducting wafers, Semiconductors, Photoresist materials

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