Fourier-plane optical microscopy is a powerful technique for studying the angularly-resolved optical properties of a plethora of materials and devices. The information about the direction of the emission of light by a sample is extracted by imaging the objective back focal plane on a two-dimensional detector, via a suitable optical system. This imaging technique is able to resolve the angular spectrum of the light over a wide angular field of view, but typically it doesn’t provide any spectral information, since it integrates the light intensity over a broad wavelength range. On the other hand, advanced hyperspectral imaging techniques are able to record the spectrum of the transmitted/reflected/emitted light at each pixel of the detector. In this work, we combine an innovative hyperspectral imaging system with Fourier-space microscopy, and we apply the novel device to the characterization of planar organic microcavities. In our system, hyperspectral imaging is performed by Fourier-transform spectroscopy thanks to an innovative common-path birefringent interferometer: it generates two delayed replicas of the light field, whose interference pattern is recorded as a function of their delay. The Fourier Transform of the resulting interferogram yields the intensity spectrum for each element of the microscope angular field-of-view. This system provides an angle-resolved hyperspectral view of the microcavities. The hyperspectral Fourier-space image clearly evidences the cavity modes both in photoluminescence and reflection, whose energy has a parabolic dependence on the emission angle. From the hyperspectral image, we reconstruct a 3D view of the parabolic cavity dispersion across the whole Fourier space.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.