Dr. Cynthia J. Bresloff Profile

Dr. Cynthia J. Bresloff

Optical Engineer

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 5 October 1999 Paper

Progress report on the optical system for closed-loop testing of the Multiple Mirror Telescope adaptive secondary mirror

Roland Sarlot, Cynthia Bresloff, James Burge, Bruce Fitz-Patrick, Patrick McGuire, Brian Stamper, Chunyu Zhao

Proceedings Volume 3779, (1999) https://doi.org/10.1117/12.368200

KEYWORDS: Mirrors, Computer generated holography, Telescopes, Holograms, Interferometers, Optical design, Wavefront sensors, Optical alignment, Beam splitters, Lenses

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Proceedings Article | 27 September 1999 Paper

Full-system laboratory testing of the F/15 deformable secondary mirror for the new MMT adaptive optics system

Patrick McGuire, Michael Lloyd-Hart, James Roger Angel, George Angeli, Robert Johnson, Bruce Fitz-Patrick, Warren Davison, Roland Sarlot, Cynthia Bresloff, John Hughes, Stephen Miller, Skip Schaller, Francois Wildi, Matthew Kenworthy, Richard Cordova, Matthew Rademacher, Mario Rascon, James Burge, Brian Stamper, Chunyu Zhao, Piero Salinari, Ciro Del Vecchio, Armando Riccardi, Guido Brusa-Zappellini, Roberto Biasi, Mario Andrighettoni, Daniele Gallieni, Claudio Franchini, David Sandler, Todd Barrett

Proceedings Volume 3762, (1999) https://doi.org/10.1117/12.363598

KEYWORDS: Adaptive optics, Mirrors, Turbulence, Actuators, Cameras, Computer generated holography, Beam splitters, Wavefront sensors, Lenses, Optical testing

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Proceedings Article | 25 June 1999 Paper

Direct comparison of EUV and visible-light interferometries

Kenneth Goldberg, Patrick Naulleau, Sang Hun Lee, Chang-Hasnain Chang, Cynthia Bresloff, Richard Gaughan, Henry Chapman, John Goldsmith, Jeffrey Bokor

Proceedings Volume 3676, (1999) https://doi.org/10.1117/12.351138

KEYWORDS: Extreme ultraviolet, Wavefronts, Cameras, Interferometry, Interferometers, Optical coatings, Monochromatic aberrations, Multilayers, Contamination, Lithography

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Proceedings Article | 5 June 1998 Paper

Characterization of the accuracy of EUV phase-shifting point diffraction interferometry

Patrick Naulleau, Kenneth Goldberg, Sang Hun Lee, Chang-Hasnain Chang, Cynthia Bresloff, Phillip Batson, David Attwood, Jeffrey Bokor

Proceedings Volume 3331, (1998) https://doi.org/10.1117/12.309563

KEYWORDS: Monochromatic aberrations, Extreme ultraviolet, Interferometers, Wavefronts, Optical testing, Sensors, Interferometry, Photomasks, Spherical lenses, Diffraction

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