Dr. Dale E. Graessle Profile

Dr. Dale E. Graessle

Astrophysicist at Harvard-Smithsonian Ctr for Astrophysics

SPIE Involvement:

Author

Publications (26)

Proceedings Article | 30 June 2006 Paper

The Chandra X-ray Observatory calibration database (CalDB): building, planning, and improving

X. Helen He, Dale Graessle, Roger Brissenden, Giuseppina Fabbiano, Janet Evans, Kenny Glotfelty, Ian Evans, Arnold Rots

Proceedings Volume 6270, 62701X (2006) https://doi.org/10.1117/12.672876

KEYWORDS: Calibration, Sensors, X-rays, Observatories, Databases, Interfaces, Optical filters, Data archive systems, Quantum efficiency, Magnetoencephalography

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Proceedings Article | 14 October 2004 Paper

Iridium optical constants from synchrotron reflectance measurements over 0.05- to 12-keV x-ray energies

Cheryl Evans, Regina Soufli, Eric Gullikson, Art Nelson, Anthony Burek, Richard Blake, Andrew Aquila, Dale Graessle

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.563160

KEYWORDS: Mirrors, Iridium, Calibration, Reflectivity, Absorption, X-rays, Coating, Synchrotrons, Contamination, Carbon

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Proceedings Article | 3 February 2004 Paper

Iridium optical constants for the Chandra X-ray Observatory from reflectance measurements of 0.05-12 keV

Andy Aquila, Richard Blake, Regina Soufli, Eric Gullikson, Anthony Burek, Dale Graessle

Proceedings Volume 5165, (2004) https://doi.org/10.1117/12.506132

KEYWORDS: Mirrors, Iridium, Reflectivity, Calibration, X-rays, Coating, Data modeling, Observatories, Synchrotrons, Absorption

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Proceedings Article | 18 July 2000 Paper

Absolute effective area of the Chandra high-resolution mirror assembly (HRMA)

Michael Juda, Douglas Swartz, Herman Marshall, Paul Plucinsky, Daniel Dewey, Richard Edgar, Terrance Gaetz, R. Donnelly, Bradford Wargelin, Stephen O'Dell, Ronald Elsner, Dale Graessle, Allyn Tennant, Brian McNamara, Daniel Schwartz, Edwin Kellogg, Leon Van Speybroeck, Diab Jerius, Martin Weisskopf, Jeffery Kolodziejczak, Norbert Schulz, S. Wolk, Laurence David, Ping Zhao

Proceedings Volume 4012, (2000) https://doi.org/10.1117/12.391566

KEYWORDS: X-rays, Calibration, Mirrors, Reflectivity, Sensors, Synchrotrons, Observatories, Photons, X-ray imaging, Optical testing

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Proceedings Article | 11 December 1998 Paper

Use of Na-beta alumina crystals in a soft x-ray synchrotron beamline

Dale Graessle, Richard Blake, Anthony Burek

Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332530

KEYWORDS: Crystals, Sodium, Reflectivity, Aluminum, Monochromators, Spectral resolution, Synchrotrons, X-rays, Silicon, Copper

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Proceedings Article | 19 November 1998 Paper

Feasibility study of ALS beamline 6.3.2 in the calibration of AXAF: initial reflectivity results

A. Stonas, Suzanne Romaine, Anthony Burek, Regina Soufli, Richard Blake, Daniel Schwartz, James Underwood, Jonathan Fitch, Eric Gullikson, Dale Graessle

Proceedings Volume 3444, (1998) https://doi.org/10.1117/12.331232

KEYWORDS: Reflectivity, Calibration, Oxygen, Mirrors, Reflection, Sensors, Carbon, Contamination, Nanoimprint lithography, Chromium

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AXAF telescope witness mirror calibrations have been carried out on ALS Beamline 6.3.2 in July 1997 and Jan-Feb 1998 to ascertain whether sufficient beam purity and signal to noise were available over the energy range 50-1000 eV. An overall accuracy of 1 percent is necessary on reflectivities to meet AXAF program requirements. Some beamline variations were incorporated - based on two previous test runs. Various filter/order-sorter combinations were used to control beam purity. A test involving strength of the N-edge dips in reflectivity versus sample angle to the beam showed the NVII, NVI, NIII, NII, and NI edges in roughly expected proportions. This verified adequate purity in all filter/order-sorter channels except the 260-454 eV channel that includes the NV and NIV edges just above the carbon K- edge. We discuss a future solution of this puzzle by other test for evaluation of the carbon contamination layer. Oxygen contamination is also ubiquitous on Ir mirrors and foils. These problems can also be handled through optimization of the data acquisition and use of control samples. In reflection Ir NIII appears out of the noise as two doublet-like bumps. Ir NII has so far been observed near the noise level < 2 percent. Averaged over many scans it too appears to be doublet-like. Scans through the NI edge near the noise level are compatible with a doublet-like or broad feature from 685-707 eV. transmission data give the NI and NIII edges better. Ir NIV and NV edges are not yet measurable for systematic reasons. NVI and NVII appear to be normal edges. Angle scans to derive the Ir and Cr layer thicknesses are feasible at approximately 900-920 eV. Reflectivities can be reliably measured at small angles to 1300 eV. This will be useful for overlap with measurements at NSLS. Optical constants derived from reflectivities in most segments of this energy range will meet requirements for AXAF. Transmission measurements are being pursued in addition, for confirmation and to augment some segments.

Proceedings Article | 19 November 1998 Paper

Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2 to 12 keV

S. Dyson, Richard Blake, Anthony Burek, Jonathan Fitch, Regina Soufli, Dale Graessle, Daniel Schwartz

Proceedings Volume 3444, (1998) https://doi.org/10.1117/12.331233

KEYWORDS: Mirrors, Reflectivity, Coating, Calibration, Iridium, Aluminum, Data modeling, Synchrotrons, Polishing, Zerodur

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As calibrations of AXAF mirrors in the 2-12 keV range are near completion, we can report that the archive is complete for the scheduled number of mirrors over the 5-12 keV range, and also over the 2010-6200 eV range. Analysis of the results for optical constants and coating layer parameters is now proceeding rapidly. To date, we have derived optical constants from 39 mirrors over 5-12 keV using our existing Fresnel Equation model, with uniform layers of Ir, Cr, and Zerodur, and the roughness algorithm of Nevot and Croce. The analysis method has been presented in our earlier papers, but its application has been expanded to all three varieties of witness mirrors use in AXAF's qualification and production coating runs. For the first and most consistent variety, which have 1 angstrom roughness, reflectances are indistinguishable from mirror to mirror save for thickness variations between coating runs. Residuals of the fits for optical constants become large when reflectance values below 18 percent are included in the fits. If such data points are ignored, values of (delta) (E) and (beta) (E) very much like those of Henke et al. over 5-11 keV are obtained. Residuals are at the 0.6-0.8 percent level, which meets calibration requirements but exceeds experimental noise. For the second variety of witness mirror, polished to obtain roughness specification similar to the flight mirrors, fits approximately within the noise level of the measurements may be obtained over 5-11 keV, for reflectance values down to 5 percent. The (delta) (E) is essentially the same as that obtained from the 1 angstrom flats; however (beta) (E) is higher by approximately 3-4 percent systematically, and the mirror-to-mirror variation is larger. The third variety of mirror was obtained with 5-7 angstrom nominal roughness. Residuals to the fits are large for the entire range of angles, in some case exceeding 2 percent with a sinusoidal character through the critical angle. Coating layer depths are similar to those found for the other mirror types, with good precision. We discuss results along with possible improvements to the model and experiments to verify it.

Proceedings Article | 19 November 1998 Paper

Development of beamline U3A for AXAF synchrotron reflectivity calibrations

J. Cobuzzi, Richard Blake, R. Francoeur, Dale Graessle, J. Sweeney, Anthony Burek, E. Sullivan, Jonathan Fitch, Russell Ingram

Proceedings Volume 3444, (1998) https://doi.org/10.1117/12.331281

KEYWORDS: Monochromators, Crystals, Reflectivity, Calibration, Mirrors, Sensors, Laser crystals, Computer programming, Sodium, Synchrotrons

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Proceedings Article | 19 November 1998 Paper

AXAF-mirror effective area calibration using the C-continuum source and solid state detectors

Walter McDermott, Ronald Elsner, Daniel Schwartz, Martin Sulkanen, Richard Edgar, Dale Graessle, Allyn Tennant, Stephen O'Dell, Jeffery Kolodziejczak, Terrance Gaetz, Leon Van Speybroeck, Robert Austin, Diab Jerius, Douglas Swartz, Ping Zhao, Martin Weisskopf, C. Zirnstein, Bradford Wargelin

Proceedings Volume 3444, (1998) https://doi.org/10.1117/12.331240

KEYWORDS: Calibration, X-rays, Sensors, Quantum efficiency, Mirrors, Error analysis, Solid state electronics, Data modeling, Spectral resolution, Solids

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Proceedings Article | 11 July 1997 Paper

Determination of optical constants for AXAF mirrors from 0.05 to 1.0 keV through reflectance measurements

Eric Gullikson, Jonathan Fitch, Dale Graessle, Anthony Burek, Richard Blake, Daniel Schwartz, Bernard Harris

Proceedings Volume 3113, (1997) https://doi.org/10.1117/12.278876

KEYWORDS: Reflectivity, Carbon, Mirrors, Iridium, Chromium, Contamination, Signal detection, Data modeling, Coating, Sensors

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Proceedings Article | 11 July 1997 Paper

Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2 to 12 keV

Richard Blake, Anthony Burek, Dale Graessle, Jonathan Fitch, Daniel Schwartz, Bernard Harris

Proceedings Volume 3113, (1997) https://doi.org/10.1117/12.278886

KEYWORDS: Absorption, Mirrors, Reflectivity, Iridium, Data modeling, Calibration, Synchrotrons, Coating, Aluminum, Algorithm development

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Proceedings Article | 11 July 1997 Paper

AXAF synchrotron witness mirror calibrations 2 to 12 keV

Daniel Schwartz, Anna Clark, Richard Blake, Bernard Harris, Anthony Burek, J. Sweeney, Dale Graessle, Jonathan Fitch

Proceedings Volume 3113, (1997) https://doi.org/10.1117/12.278867

KEYWORDS: Mirrors, Reflectivity, Calibration, Coating, Iridium, Aluminum, X-rays, Synchrotrons, Contamination, Polishing

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Proceedings Article | 31 October 1996 Paper

Modeling the diffraction efficiencies of the AXAF high-energy transmission gratings: II

Peter Bulicke, R. Fliegauf, C. Baluta, Stefan Kraft, Jiahong Juda, Jonathan Woo, Kathryn Flanagan, Thomas Markert, Jeremy Drake, Gerhard Ulm, James Bauer, John Davis, Frank Scholze, T. Fang, Daniel Dewey, Jonathan Fitch, Dale Graessle

Proceedings Volume 2808, (1996) https://doi.org/10.1117/12.256038

KEYWORDS: Sensors, Diffraction gratings, Diffraction, Calibration, Data modeling, Monochromators, Energy efficiency, Gold, X-rays, Synchrotron radiation

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Proceedings Article | 19 July 1996 Paper

ACIS UV/optical blocking filter calibration at the National Synchrotron Light Source

John Nousek, Forbes Powell, George Chartas, Leisa Townsley, Dale Graessle, Richard Blake, Gordon Garmire

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245111

KEYWORDS: X-rays, Data modeling, Optical filters, Absorption, Image filtering, Calibration, Spectroscopy, Chemical species, Sensors, Absorption filters

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Proceedings Article | 19 July 1996 Paper

Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV

Daniel Schwartz, John Hughes, Dale Graessle, Bernard Harris, Richard Blake, Jonathan Fitch, Dan Nguyen

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245108

KEYWORDS: Mirrors, Reflectivity, Iridium, Calibration, Sensors, X-rays, Coating, Absorption, Data modeling, Monochromators

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Proceedings Article | 19 July 1996 Paper

Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV

Daniel Schwartz, Bernard Harris, Jonathan Fitch, Richard Blake, Anna Clark, Dale Graessle

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245107

KEYWORDS: Mirrors, Calibration, Reflectivity, Coating, Sensors, Synchrotrons, Iridium, X-rays, Aluminum, Reflectometry

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Proceedings Article | 19 July 1996 Paper

Iridium optical constants from x-ray transmission measurements over 2 to 12 keV

Mark Schattenburg, Jiahong Juda, Dale Graessle, Jonathan Fitch, Richard Blake, Eric Gullikson, Bernard Harris

Proceedings Volume 2805, (1996) https://doi.org/10.1117/12.245109

KEYWORDS: Iridium, X-rays, Absorption, X-ray optics, Error analysis, Optical coatings, Thin film coatings, Thin films, Synchrotrons, Light sources

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Proceedings Article | 1 September 1995 Paper

Modeling the diffraction efficiencies of the AXAF high-energy transmission gratings

Kathryn Flanagan, John Davis, Dale Graessle, Daniel Dewey, Christie Nelson, Thomas Markert, James Bauer

Proceedings Volume 2518, (1995) https://doi.org/10.1117/12.218399

KEYWORDS: Data modeling, Diffraction gratings, X-rays, Gold, Diffraction, Calibration, Synchrotrons, Plating, Sensors, Mirrors

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Proceedings Article | 11 November 1994 Paper

Molecular contamination study of iridium-coated x-ray mirrors

Ronald Elsner, Jiahong Juda, J. Reynolds, Stephen O'Dell, Jonathan Fitch, T. Burbine, Dale Graessle, William Podgorski

Proceedings Volume 2279, (1994) https://doi.org/10.1117/12.193173

KEYWORDS: Mirrors, X-rays, Iridium, Reflectivity, Contamination, Calibration, Coating, Synchrotrons, Absorption, Ellipsometry

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Proceedings Article | 16 September 1994 Paper

Efficiency measurements and modeling of the Advanced X-ray Astrophysics Facility (AXAF) high-energy transmission gratings

Dale Graessle, Christie Nelson, Y. Song, Thomas Markert, Mark Schattenburg, Kathryn Flanagan, James Bauer, Richard Blake, Eric Gullikson

Proceedings Volume 2280, (1994) https://doi.org/10.1117/12.186811

KEYWORDS: Sensors, Diffraction gratings, Energy efficiency, Diffraction, Data modeling, Synchrotrons, X-rays, Gold, Monochromators, Calibration

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Proceedings Article | 16 September 1994 Paper

Synchrotron x-ray transmission measurements in the calibration program for the UV/ion shields of the AXAF HRC

David Breslau, Marco Barbera, Kathryn Flanagan, Martin Zombeck, Dale Graessle

Proceedings Volume 2280, (1994) https://doi.org/10.1117/12.186834

KEYWORDS: Sensors, Monochromators, X-rays, Calibration, Data modeling, Synchrotrons, Absorption, Microchannel plates, Chemical elements, Statistical modeling

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Proceedings Article | 21 January 1993 Paper

Optical constants from mirror reflectivities measured at synchrotrons

Dale Graessle, Jeffrey Davis, T. Burbine, Eric Gullikson, Richard Blake

Proceedings Volume 1742, (1993) https://doi.org/10.1117/12.140603

KEYWORDS: Reflectivity, Gold, Nickel, Synchrotrons, Mirrors, Scattering, Carbon, Absorption, Electrons, Refraction

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Proceedings Article | 21 January 1993 Paper

Reflectance calibrations of AXAF mirror samples at absorption edges using synchrotron radiation

Daniel Schwartz, T. Burbine, Edwin Kellogg, Dale Graessle, Richard Blake, J. Cobuzzi, Ping Gong

Proceedings Volume 1742, (1993) https://doi.org/10.1117/12.140554

KEYWORDS: Mirrors, Reflectivity, Gold, Absorption, Iridium, Calibration, Platinum, Nickel, Coating, Synchrotrons

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Proceedings Article | 21 January 1993 Paper

X-ray reflectivity of the AXAF Veta-I optics

Edwin Kellogg, John Hughes, Martin Weisskopf, Leon Van Speybroeck, Ronald Elsner, Ping Zhao, George Chartas, Stephen O'Dell, Dale Graessle

Proceedings Volume 1742, (1993) https://doi.org/10.1117/12.140552

KEYWORDS: Reflectivity, X-rays, Mirrors, Zerodur, X-ray optics, Calibration, Scattering, Error analysis, Information operations, Synchrotrons

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Proceedings Article | 1 January 1992 Paper

Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results

J. Cobuzzi, Roger Brissenden, Jeffrey Davis, Fred Mootz, John Hughes, Dale Graessle, Martin Zombeck, Edwin Kellogg, Richard Blake, Patrick Slane, Daniel Schwartz

Proceedings Volume 1546, (1992) https://doi.org/10.1117/12.51222

KEYWORDS: Reflectivity, Calibration, Gold, Sensors, Nickel, Synchrotrons, Mirrors, Grazing incidence, Reflectometry, Optical coatings

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