Dr. Daniel Bratton
at Cornell Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 29 March 2006 Paper
Proceedings Volume 6153, 61531D (2006) https://doi.org/10.1117/12.656630
KEYWORDS: Glasses, Lithography, Bridges, Electron beam lithography, Extreme ultraviolet lithography, Extreme ultraviolet, Semiconducting wafers, Line edge roughness, Magnesium, FT-IR spectroscopy

Proceedings Article | 4 May 2005 Paper
Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.607235
KEYWORDS: Glasses, Line edge roughness, Extreme ultraviolet lithography, Electron beam lithography, Lithography, Extreme ultraviolet, Polymers, Silicon, Chemical elements, Molecules

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