Mr. Daniel Kayser Profile

Daniel Kayser

at A & A Technologies GmbH

SPIE Involvement:

Author

Publications (12)

Proceedings Article | 7 March 2006 Paper

High-resolution measurement of extended technical surfaces with scalable topometry

Wolfgang Osten, Daniel Kayser, Thorsten Bothe, Werner Jueptner

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498445

KEYWORDS: Fractal analysis, Sensors, Inspection, Image resolution, Feature extraction, Image sensors, Ceramics, Image segmentation, Shape analysis, Tolerancing

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Proceedings Article | 10 September 2005 Paper

Compression of digital holographic data using its electromagnetic field properties

Daniel Kayser, Thomas Kreis, Werner Juptner

Proceedings Volume 5908, 59080C (2005) https://doi.org/10.1117/12.616723

KEYWORDS: Holograms, Digital holography, Electromagnetism, Quantization, Holography, Speckle, Optical simulations, Image compression, Phase shifts, Data compression

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Proceedings Article | 18 August 2005 Paper

Resolution increase by aperture synthesis in digital holography

Thomas Kreis, Daniel Kayser

Proceedings Volume 5880, 58800F (2005) https://doi.org/10.1117/12.617010

KEYWORDS: Charge-coupled devices, Information technology, Digital holography, Radon, Synthetic apertures, CCD cameras, Imaging systems, Point spread functions, Holograms, Optical diagnostics

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SPIE Journal Paper | 1 October 2004

Scaled topometry in a multisensor approach

Daniel Kayser, Thorsten Bothe, Wolfgang Osten

OE, Vol. 43, Issue 10, (October 2004) https://doi.org/10.1117/12.10.1117/1.1788690

KEYWORDS: Fractal analysis, Sensors, Projection systems, Wavelets, Inspection, Cameras, Detection and tracking algorithms, Tolerancing, Optical engineering, Image resolution

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Proceedings Article | 27 May 2003 Paper

Detection of faults in interferometric fringe patterns by optical wavelet filtering

Guenther Wernicke, Frank Kallmeyer, S. Krueger, Hartmut Gruber, Daniel Kayser

Proceedings Volume 4933, (2003) https://doi.org/10.1117/12.516636

KEYWORDS: Wavelets, Fringe analysis, Image filtering, Eye, Interferometry, Optical correlators, Image classification, Spatial light modulators, Spatial frequencies, Optical filters

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Proceedings Article | 22 May 2003 Paper

Dynamic classification of fringe patterns in holographic interferometry by optical wavelet filtering

Frank Kallmeyer, Sven Krueger, Guenther Wernicke, Hartmut Gruber, Daniel Kayser

Proceedings Volume 5011, (2003) https://doi.org/10.1117/12.477512

KEYWORDS: Wavelets, Fringe analysis, Image filtering, Interferometry, Image classification, Eye, Optical correlators, Spatial frequencies, Spatial light modulators, Holographic interferometry

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Proceedings Article | 20 June 2002 Paper

Scaled multisensor inspection of extended surfaces for industrial quality control

Daniel Kayser, Thorsten Bothe, Wolfgang Osten

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472225

KEYWORDS: Inspection, Sensors, Tolerancing, Fractal analysis, Wavelets, Data integration, Detection and tracking algorithms, Optical testing, Assembly tolerances, Process control

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Proceedings Article | 20 June 2002 Paper

Optical processing for the detection of faults in interferometric patterns

Frank Kallmeyer, Sven Krueger, Guenther Wernicke, Hartmut Gruber, Nazif Demoli, Wolfgang Osten, Daniel Kayser

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472237

KEYWORDS: Wavelets, Image filtering, Fringe analysis, Interferometry, Optical filters, Eye, Spatial frequencies, Image compression, Image classification, Optical correlators

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SPIE Journal Paper | 1 January 2001

Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Sven Krueger, Guenther Wernicke, Wolfgang Osten, Daniel Kayser, Nazif Demoli, Hartmut Gruber

JEI, Vol. 10, Issue 01, (January 2001) https://doi.org/10.1117/12.10.1117/1.1318908

KEYWORDS: Wavelets, Fringe analysis, Image filtering, Interferometry, Feature extraction, Optical filters, Image classification, Spatial light modulators, Filtering (signal processing), Image processing

Proceedings Article | 21 March 2000 Paper

Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Sven Krueger, Guenther Wernicke, Wolfgang Osten, Daniel Kayser, Nazif Demoli, Hartmut Gruber

Proceedings Volume 3966, (2000) https://doi.org/10.1117/12.380068

KEYWORDS: Wavelets, Fringe analysis, Image filtering, Optical filters, Feature extraction, Interferometry, Image classification, Image processing, Filtering (signal processing), Spatial light modulators

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