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Darcy Hart
Optics Technology Segment Director at Minnetronix Medical, Inc.
SPIE Involvement:
Author | Science Fair Judge
Publications (5)
Proceedings Article | 20 September 2013 Paper
New generation CMOS 2D imager evaluation and qualification for semiconductor inspection applications
Proceedings Volume 8819, 881907 (2013) https://doi.org/10.1117/12.2026963
KEYWORDS: Cameras, Inspection, Semiconductors, Image resolution, Sensors, Imaging systems, CMOS technology, Signal to noise ratio, Neodymium, Content addressable memory
Proceedings Article | 20 September 2013 Paper
Illumination design for semiconductor backlight inspection and application extensions
Wei Zhou, Todd Rutherford, Darcy Hart
Proceedings Volume 8819, 881908 (2013) https://doi.org/10.1117/12.2026967
KEYWORDS: Light emitting diodes, Collimators, Semiconducting wafers, Semiconductors, Inspection, Geometrical optics, Collimation, Waveguides, Manufacturing, Silicon
Proceedings Article | 6 April 2012 Paper
Technology review for silicon imagers-based see-through-silicon inspection and metrology
Wei Zhou, Max Guest, Darcy Hart
Proceedings Volume 8324, 83241Q (2012) https://doi.org/10.1117/12.918500
KEYWORDS: Cameras, Imaging systems, Silicon, Inspection, Indium gallium arsenide, Signal to noise ratio, Semiconducting wafers, Metrology, Device simulation, Semiconductors
Proceedings Article | 24 September 2011 Paper
Laser dark-field illumination system modeling for semiconductor inspection applications
Wei Zhou, Darcy Hart, Rajiv Roy
Proceedings Volume 8170, 81700P (2011) https://doi.org/10.1117/12.902234
KEYWORDS: Photons, Semiconducting wafers, Semiconductor lasers, Systems modeling, Semiconductors, Inspection, Microscopes, Laser beam propagation, Signal detection, Laser applications
Proceedings Article | 20 September 2011 Paper
See-through-silicon inspection application studies based on traditional silicon imager
Wei Zhou, Darcy Hart, Noah Bock, Rolf Shervey
Proceedings Volume 8105, 81050H (2011) https://doi.org/10.1117/12.892576
KEYWORDS: Signal to noise ratio, Silicon, Image processing, Inspection, Sensors, Semiconducting wafers, Machine vision, Reflection, Imaging systems, Human vision and color perception
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