Dr. David Bruce Burckel
Principal Member of Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 4 October 2023 Presentation
Proceedings Volume PC12646, PC126460T (2023) https://doi.org/10.1117/12.2678379
KEYWORDS: Fabrication, Etching, Electron beam lithography, Dielectrics, Defense and security, Silicon, Organization management, Nanotechnology, Materials processing, Lithography

SPIE Journal Paper | 12 February 2021
JNP, Vol. 15, Issue 01, 016005, (February 2021) https://doi.org/10.1117/12.10.1117/1.JNP.15.016005
KEYWORDS: Plasmonics, Gold, Finite element methods, Polarization, Data modeling, Phase shifts, Analytical research, Instrument modeling, Diffraction, Chemical elements

Proceedings Article | 21 August 2020 Presentation + Paper
Proceedings Volume 11467, 114670J (2020) https://doi.org/10.1117/12.2568200
KEYWORDS: Data modeling, Polarization, Instrument modeling, Finite element methods, Plasmonics, Scatter measurement, Phase shifts, Optical components, Near field

Proceedings Article | 4 March 2019 Paper
Proceedings Volume 10930, 1093005 (2019) https://doi.org/10.1117/12.2513632
KEYWORDS: Silicon, Polymers, Metamaterials, Scanning electron microscopy, Projection lithography, Chemical mechanical planarization, Lithography, Electron beam lithography, Etching, Microelectromechanical systems

Proceedings Article | 19 September 2018 Paper
Proceedings Volume 10719, 107190L (2018) https://doi.org/10.1117/12.2322185
KEYWORDS: Polarization, Magnetism, Split ring resonators, Scattering, Optical arrays, Optical metamaterials, Silicon, Data modeling, 3D modeling, Finite-difference time-domain method

Showing 5 of 17 publications
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