Dr. Edward W. Reutzel
Head of LPT Dept at Applied Research Lab
SPIE Involvement:
Author | Editor
Publications (7)

Proceedings Article | 24 April 2020 Presentation
Proceedings Volume 11381, 1138105 (2020) https://doi.org/10.1117/12.2559129
KEYWORDS: Ultrasonics, Additive manufacturing, Directed energy weapons, Titanium, Nondestructive evaluation, Surface roughness, Metals, Q switched lasers, Nd:YAG lasers, Interferometers

Proceedings Article | 6 April 2016 Paper
Abdalla Nassar, Edward Reutzel, Stephen Brown, John Morgan, Jacob Morgan, Donald Natale, Rick Tutwiler, David Feck, Jeffery Banks
Proceedings Volume 9738, 97380R (2016) https://doi.org/10.1117/12.2217855
KEYWORDS: Imaging systems, Pyrometry, Image processing, Additive manufacturing, Sensing systems, Cameras, Temperature metrology, Directed energy weapons, Laser optics, Calibration

Proceedings Article | 14 May 2015 Paper
Bryant Foster, Edward Reutzel, Abdalla Nassar, Corey Dickman, Benjamin Hall
Proceedings Volume 9489, 94890B (2015) https://doi.org/10.1117/12.2180654
KEYWORDS: Additive manufacturing, Metals, Control systems, Image processing, Sensors, Cameras, Laser systems engineering, 3D modeling, Infrared cameras, Process control

Proceedings Article | 16 September 2013 Paper
A. Raghavan, T. Palmer, A. Domask, S. Mohney, E. Reutzel, T. DebRoy
Proceedings Volume 8826, 882606 (2013) https://doi.org/10.1117/12.2023978
KEYWORDS: Resistance, Aluminum, Silicon, Pulsed laser operation, Laser processing, Semiconducting wafers, Semiconductor lasers, Solar cells, Fiber lasers, Silica

Proceedings Article | 15 October 2012 Paper
Proceedings Volume 8549, 85493H (2012) https://doi.org/10.1117/12.927446
KEYWORDS: Diodes, Resistance, Silicon, Doping, Laser processing, Pulsed laser operation, Semiconducting wafers, Diagnostics, Aluminum

Showing 5 of 7 publications
Proceedings Volume Editor (5)

Conference Committee Involvement (7)
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, MD, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, CA, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, MD, United States
Laser Processing and Fabrication for Solar, Displays, and Optoelectronic Devices III
20 August 2014 | San Diego, California, United States
Showing 5 of 7 Conference Committees
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