Els Moens
Team Leader R&D at ADB Airfield Solutions
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 9 May 2012 Paper
Proceedings Volume 8428, 842813 (2012) https://doi.org/10.1117/12.922203
KEYWORDS: Sensors, Channel projecting optics, Spatial resolution, CMOS sensors, Distortion, Micro optics, Modulation transfer functions, Lens design, Geometrical optics, Light sources

Proceedings Article | 14 May 2010 Paper
Proceedings Volume 7716, 77162D (2010) https://doi.org/10.1117/12.854455
KEYWORDS: Channel projecting optics, Lenses, Sensors, Image sensors, Eye, Distortion, Modulation transfer functions, Spatial resolution, Image quality, Superposition

Proceedings Article | 13 May 2010 Paper
Michael Vervaeke, Els Moens, Youri Meuret, Heidi Ottevaere, Carl Van Buggenhout, Piet De Pauw, Hugo Thienpont
Proceedings Volume 7716, 77161P (2010) https://doi.org/10.1117/12.853643
KEYWORDS: Tolerancing, Phase only filters, Monte Carlo methods, Assembly tolerances, 3D modeling, Statistical analysis, Optics manufacturing, Navigation systems, Manufacturing, Silicon

Proceedings Article | 14 May 2008 Paper
Els Moens, Michael Vervaeke, Youri Meuret, Heidi Ottevaere, Carl Van Buggenhout, Piet De Pauw, Hugo Thienpont
Proceedings Volume 6992, 69920X (2008) https://doi.org/10.1117/12.779981
KEYWORDS: Phase only filters, Tolerancing, Temperature metrology, Epoxies, Monte Carlo methods, Compound parabolic concentrators, Polymer optical fibers, 3D modeling, Light, Refractive index

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