Eric T. S. Bissell
at Univ. of Central Florida
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 25 May 2024 Open Access
JOM, Vol. 4, Issue 03, 031203, (May 2024) https://doi.org/10.1117/12.10.1117/1.JOM.4.3.031203
KEYWORDS: Antimony, Selenium, Thin films, Particles, Raman spectroscopy, Scanning electron microscopy, Silicon, Heat treatments, Film thickness, Annealing

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