Dr. Erik H. M. Heijne
Instrumentation Physicist at CERN
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 29 September 2004 Paper
Lukas Tlustos, Michael Campbell, Erik Heijne, Xavier Llopart
Proceedings Volume 5501, (2004) https://doi.org/10.1117/12.551518
KEYWORDS: Sensors, Imaging systems, Electrons, Signal processing, Silicon, Semiconductors, Photon counting, X-rays, Amplifiers, X-ray imaging

Proceedings Article | 10 November 1998 Paper
Maria Bisogni, M. Campbell, M. Conti, Pasquale Delogu, Maria Fantacci, Erik Heijne, Paolo Maestro, G. Magistrati, V. Marzulli, G. Meddeler, Bettina Mikulec, Elena Pernigotti, Valeria Rosso, C. Schwarz, W. Snoeys, Simone Stumbo, J. Watt
Proceedings Volume 3445, (1998) https://doi.org/10.1117/12.330288
KEYWORDS: Sensors, Electronics, Photon counting, Gallium arsenide, Aluminum, Signal detection, Camera shutters, X-ray detectors, X-rays, Capacitance

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