Dr. Eugenia D. Eugenieva
at KLA Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 October 2008 Paper
Proceedings Volume 7122, 71221B (2008) https://doi.org/10.1117/12.801945
KEYWORDS: Photomasks, Inspection, Semiconducting wafers, Finite-difference time-domain method, Wafer inspection, Manufacturing, Printing, Lithography, Reticles, Optical proximity correction

Proceedings Article | 7 May 1999 Paper
E. Eugenieva, Anna Dikovska, Peter Atanasov
Proceedings Volume 3571, (1999) https://doi.org/10.1117/12.347654
KEYWORDS: Waveguides, Wave propagation, Pulsed laser deposition, Geometrical optics, Planar waveguides, Active optics, Light wave propagation, Waveguide lasers, Beam shaping, Sapphire

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