Dr. Ewan McGhee
at Imperial College London
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 August 2006 Paper
N. Angarita-Jaimes, E. McGhee, M. Chennaoui, H. Campbell, S. Zhang, C. Towers, A. Greenaway, D. Towers
Proceedings Volume 6292, 62920K (2006) https://doi.org/10.1117/12.681561
KEYWORDS: Particles, Image segmentation, Image processing, Wavefronts, Wavefront sensors, 3D metrology, Metrology, Calibration, Imaging systems, 3D image processing

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