Ms. Ewelina N. Lucow Profile

Ewelina N. Lucow

at SolFocus Inc

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Proceedings Article | 9 September 2008 Paper

High concentration (2500 suns), high throughput, automated flash tester with calibrated color balance and intensity control

Michael Ludowise, Sean Taylor, Ewelina Lucow, Hing Chan

Proceedings Volume 7043, 704309 (2008) https://doi.org/10.1117/12.795364

KEYWORDS: Lamps, Semiconducting wafers, Sun, Calibration, Data acquisition, Power supplies, Xenon, Reflectors, Solar cells, Wafer testing

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SolFocus has designed and built a flexible and adaptable solar flash tester capable of reaching in excess of 2500x suns flux using a commercially available Xenon flash and power supply. Using calibrated isotype cells and photodetectors, the intensity and color balance of the flash are controlled through software algorithms that compensate for tube aging and thermal drift. The data acquisition system dynamically normalizes each of the 1600 I-V data pairs to the lamp intensity during each flash. Up to 32 cells can be measured simultaneously, with a flash re-cycle time of 3 seconds. The dynamic current range is 100μA to 10A over 0 to 5V. Test ranges are limited by user input through a modern GUI screen. The system is mated to a commercially available probe station tester which allows automated testing of up to 150mm diameter wafers, and is capable of testing a 4000 cell wafer in less than 8 minutes. The core software and optical components are easily adaptable to receiver and full panel testing as well. Data on the calibration and performance of the flash tester, the dynamic range achieved in test, and throughputs obtained during operation are presented.

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