Faisal Ahmed Memon
at Mehran Univ of Engineering & Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 May 2018 Paper
Faisal Ahmed Memon, Francesco Morichetti, Andrea Melloni
Proceedings Volume 10683, 106833I (2018) https://doi.org/10.1117/12.2314702
KEYWORDS: Waveguides, Refractive index, Integrated photonics, Sputter deposition, Resonators, Atomic force microscopy, Scanning electron microscopy, Spectroscopic ellipsometry

Proceedings Article | 17 May 2018 Paper
Faisal Ahmed Memon, Francesco Morichetti, Andrea Melloni
Proceedings Volume 10683, 106832T (2018) https://doi.org/10.1117/12.2306624
KEYWORDS: Waveguides, Refractive index, Silicon, Integrated photonics, Atomic force microscopy, Scanning electron microscopy, Sputter deposition

Proceedings Article | 17 May 2017 Paper
Faisal Ahmed Memon, Francesco Morichetti, Claudio Somaschini, Giosue Iseni, Andrea Melloni
Proceedings Volume 10242, 1024212 (2017) https://doi.org/10.1117/12.2265309
KEYWORDS: Silicon, Silicon carbide, Refractive index, Dielectrics, Thin films, Absorption, Spectroscopic ellipsometry, Oscillators, Integrated photonics, Ellipsometry, Waveguides, Sputter deposition, Optical properties, Thin film deposition, Spectroscopy

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