Prof. Franck Delmotte
Professor at Institut d'Optique Graduate School
SPIE Involvement:
Author
Publications (39)

Proceedings Article | 24 June 2024 Poster + Paper
Corentin Nannini, Nolann Ravinet, Antoine Lejars, Evgueni Meltchakov, Franck Delmotte
Proceedings Volume 13020, 130200X (2024) https://doi.org/10.1117/12.3016698
KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Interfaces, Simulations, Imaging spectroscopy

Proceedings Article | 18 June 2024 Presentation
Franck Delmotte, Sébastien de Rossi, Evgueni Meltchakov, Charles Bourassin-Bouchet, Eirini Papagiannouli, Arnaud Jérome
Proceedings Volume PC13020, PC130200L (2024) https://doi.org/10.1117/12.3025173
KEYWORDS: Optical coatings, Extreme ultraviolet, X-rays, Ultrafast phenomena, Multilayers, High harmonic generation, X-ray optics, X-ray lasers, Physics, Physical coherence

Proceedings Article | 18 June 2024 Presentation
Evgueni Meltchakov, Blandine Capitanio, Sébastien de Rossi, Eirini Papagiannouli, Pascal Mercere, Franck Delmotte
Proceedings Volume PC13020, PC130200E (2024) https://doi.org/10.1117/12.3015927
KEYWORDS: Multilayers, Windows, Reflectivity, Optical coatings, Thin film coatings, X-rays, X-ray optics, Time metrology, Thin film growth, Oxygen

Proceedings Article | 7 June 2023 Presentation + Paper
A. H. Mahmoud, S. de Rossi, E. Meltchakov, E. Papagiannouli, B. Capitanio, M. Thomasset, A. Philippon, F. Auchère, F. Delmotte
Proceedings Volume 12576, 1257608 (2023) https://doi.org/10.1117/12.2665459
KEYWORDS: Extreme ultraviolet, Diffraction gratings, Multilayers, Atomic force microscopy, X-rays, Reflectivity, Optical gratings, Diffraction, Synchrotrons, Surface roughness

Proceedings Article | 6 June 2023 Presentation
Franck Delmotte, Evgueni Meltchakov, Sébastien de Rossi, Amr H. Mahmoud, Arnaud Jérôme, Eirini Papagiannouli, Charles Bourassin-Bouchet
Proceedings Volume 12578, 125780F (2023) https://doi.org/10.1117/12.2670923
KEYWORDS: Multilayers, Extreme ultraviolet, Ultrafast phenomena, Solar processes, EUV optics, Telescopes, Optical coatings, Mirrors, X-ray lasers, Optical properties

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12494, 1249409 (2023) https://doi.org/10.1117/12.2660664
KEYWORDS: Refractive index, Transmittance, Chromium, Extreme ultraviolet, Thin films, Reflectivity, Contamination, Film thickness, Multilayers

Proceedings Article | 6 July 2018 Presentation + Paper
J.-P. Halain, E. Renotte, F. Auchère, D. Berghmans, F. Delmotte, L. Harra, W. Schmutz, U. Schühle, R. Aznar Cuadrado, C. Dumesnil, M. Gyo, T. Kennedy, C. Verbeeck, J. Barbay, B. Giordanengo, S. Gissot , A. Gottwald, K. Heerlein, M.-L. Hellin, A. Hermans, V. Hervier, L. Jacques, C. Laubis, A. Mazzoli, S. Meining, R. Mercier, A. Philippon, S. Roose, L. Rossi, F. Scholze, P. Smith, L. Teriaca, X. Zhang, P. Rochus
Proceedings Volume 10699, 106990H (2018) https://doi.org/10.1117/12.2309339
KEYWORDS: Extreme ultraviolet, Calibration, Cameras, Mirrors, Optical alignment, Sensors, Telescopes, Interferometry, Fermium, Frequency modulation

Proceedings Article | 5 June 2018 Paper
Proceedings Volume 10691, 106911U (2018) https://doi.org/10.1117/12.2313346
KEYWORDS: Aluminum, Extreme ultraviolet, Multilayers, Molybdenum, Mirrors, Silicon carbide, Magnesium, Zirconium, Optical coatings, Absorption

SPIE Journal Paper | 17 November 2017 Open Access
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
OE, Vol. 56, Issue 11, 119801, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.119801

SPIE Journal Paper | 1 November 2017
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
OE, Vol. 56, Issue 11, 117101, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.117101
KEYWORDS: Reflectivity, Mirrors, X-rays, X-ray fluorescence spectroscopy, Interfaces, Chromium, Multilayers, Sputter deposition, Sensors, Luminescence

Proceedings Article | 22 September 2015 Paper
F. Delmotte, M. Dehlinger, Ch. Bourassin-Bouchet, S. de Rossi, A. Jerome, E. Meltchakov, F. Varnière
Proceedings Volume 9589, 958907 (2015) https://doi.org/10.1117/12.2188048
KEYWORDS: Reflectivity, Mirrors, Multilayers, Aluminum, Silicon, Silicon carbide, Absorption, Laser sources, Scandium, Boron

Proceedings Article | 21 September 2015 Paper
J.-P. Halain, A. Mazzoli, S. Meining, P. Rochus, E. Renotte, F. Auchère, U. Schühle, F. Delmotte, C. Dumesnil, A. Philippon, R. Mercier, A. Hermans
Proceedings Volume 9604, 96040H (2015) https://doi.org/10.1117/12.2185631
KEYWORDS: Mirrors, Sensors, Optical alignment, Extreme ultraviolet, Interferometry, Imaging systems, Optical design, Staring arrays, Aluminum, Bandpass filters

Proceedings Article | 21 September 2015 Paper
J.-P. Halain, P. Rochus, E. Renotte, A. Hermans, L. Jacques, F. Auchère, D. Berghmans, L. Harra, U. Schühle, W. Schmutz, A. Zhukov, R. Aznar Cuadrado, F. Delmotte, C. Dumesnil, M. Gyo, T. Kennedy, P. Smith, J. Tandy, R. Mercier, C. Verbeeck
Proceedings Volume 9604, 96040G (2015) https://doi.org/10.1117/12.2185634
KEYWORDS: Scanning tunneling microscopy, Fermium, Frequency modulation, Instrument modeling, Extreme ultraviolet, Optical filters, Sensors, Space operations, Imaging systems, Manufacturing

Proceedings Article | 5 September 2014 Paper
Franck Delmotte, Charles Bourassin-Bouchet, Sébastien de Rossi, Evgueni Meltchakov, Angelo Giglia, Stefano Nannarone
Proceedings Volume 9207, 92070K (2014) https://doi.org/10.1117/12.2061022
KEYWORDS: Mirrors, Extreme ultraviolet, X-rays, Reflectivity, X-ray characterization, Phase measurement, Silicon, Signal attenuation, Data modeling, Atomic, molecular, and optical physics

Proceedings Article | 24 July 2014 Paper
J.-P. Halain, P. Rochus, E. Renotte, F. Auchère, D. Berghmans, L. Harra, U. Schühle, W. Schmutz, A. Zhukov, R. Aznar Cuadrado, F. Delmotte, C. Dumesnil, M. Gyo, T. Kennedy, R. Mercier, F. Verbeeck, M. Thome, K. Heerlein, A. Hermans, L. Jacques, A. Mazzoli, S. Meining, L. Rossi, J. Tandy, P. Smith, B. Winter
Proceedings Volume 9144, 914408 (2014) https://doi.org/10.1117/12.2055207
KEYWORDS: Sensors, Optical filters, Mirrors, Scanning tunneling microscopy, Cameras, Space operations, Mathematical modeling, Interfaces, Extreme ultraviolet, Imaging systems

Proceedings Article | 26 September 2013 Paper
Franck Delmotte, Evgueni Meltchakov, Sébastien de Rossi, Françoise Bridou, Arnaud Jérome, François Varnière, Raymond Mercier, Frédéric Auchère, Xueyan Zhang, Bruno Borgo, Cydalise Dumesnil, Serge François, Marc Roulliay, Udo Strauch
Proceedings Volume 8862, 88620A (2013) https://doi.org/10.1117/12.2036050
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Telescopes, Space telescopes, Synchrotrons, Aluminum, Mirrors, Deposition processes, Space operations

Proceedings Article | 3 May 2013 Paper
B. Emprin, Ph. Troussel, B. Villette, F. Delmotte
Proceedings Volume 8777, 87771B (2013) https://doi.org/10.1117/12.2016832
KEYWORDS: Mirrors, Reflectivity, Chromium, Silica, Multilayers, X-rays, Silicon, Calibration, Optical filters, Sensors

Proceedings Article | 3 May 2013 Paper
E. Meltchakov, S. De Rossi, R. Mercier, F. Varniere, A. Jérome, F. Auchere, X. Zhang, M. Roulliay, F. Delmotte
Proceedings Volume 8777, 87771C (2013) https://doi.org/10.1117/12.2017058
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Iron, Aluminum, Solar processes, Mirrors, Space telescopes, Optical coatings, Telescopes

Proceedings Article | 17 September 2012 Paper
J.-P. Halain, P. Rochus, E. Renotte, T. Appourchaux, D. Berghmans, L. Harra, U. Schühle, W. Schmutz, F. Auchère, A. Zhukov, C. Dumesnil, F. Delmotte, T. Kennedy, R. Mercier, D. Pfiffner, L. Rossi, J. Tandy, A. BenMoussa, P. Smith
Proceedings Volume 8443, 844307 (2012) https://doi.org/10.1117/12.924343
KEYWORDS: Sensors, Extreme ultraviolet, Optical filters, Prototyping, Coating, Instrument modeling, Thermal modeling, Cameras, Mirrors, Sun

Proceedings Article | 7 October 2011 Paper
Proceedings Volume 8148, 81480N (2011) https://doi.org/10.1117/12.893355
KEYWORDS: Transmittance, Imaging systems, Optical filters, Multilayers, Thin films, Extreme ultraviolet, Aluminum, Visible radiation, Sun, Image filtering

Proceedings Article | 5 October 2011 Paper
A. Ziani, F. Delmotte, C. Le Paven-Thivet, E. Meltchakov, F. Bridou, A. Jérome, M. Roulliay, K. Gasc
Proceedings Volume 8168, 81681S (2011) https://doi.org/10.1117/12.896433
KEYWORDS: Reflectivity, Aluminum, Ion beams, Mirrors, Sputter deposition, Multilayers, Extreme ultraviolet, Reflectometry, Ultraviolet radiation, X-rays

Proceedings Article | 4 October 2011 Paper
E. Meltchakov, A. Ziani, F. Auchere, X. Zhang, M. Roulliay, S. De Rossi, Ch. Bourassin-Bouchet, A. Jérome, F. Bridou, F. Varniere, F. Delmotte
Proceedings Volume 8168, 816819 (2011) https://doi.org/10.1117/12.896577
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Aluminum, Silicon carbide, Silicon, X-rays, Interfaces, Synchrotron radiation, Temperature metrology

Proceedings Article | 4 October 2011 Paper
S. de Rossi, C. Bourassin-Bouchet, E. Meltchakov, F. Delmotte, Zsolt Diveki, Thierry Ruchon, Pascal Salières, Bertrand Carré
Proceedings Volume 8168, 816817 (2011) https://doi.org/10.1117/12.902320
KEYWORDS: Mirrors, Reflectivity, Extreme ultraviolet, Synchrotrons, Molybdenum, Silicon, Ultrafast phenomena, Photons, Phase measurement, Absorption

Proceedings Article | 28 September 2011 Paper
Ph. Troussel, D. Dennetiere, R. Rosch, C. Reverdin, H. Hartmann, F. Bridou, E. Meltchakov, F. Delmotte
Proceedings Volume 8139, 81390C (2011) https://doi.org/10.1117/12.895944
KEYWORDS: Microscopes, Mirrors, Reflectivity, X-rays, X-ray imaging, Multilayers, Spatial resolution, Grazing incidence, Diagnostics, Imaging systems

Proceedings Article | 18 February 2011 Paper
F. Delmotte, S. de Rossi, C. Bourassin-Bouchet, E. Meltchakov, A. Ziani, F. Choueikani, F. Bridou, A. Jérome, F. Varnière
Proceedings Volume 7995, 79952Q (2011) https://doi.org/10.1117/12.888199
KEYWORDS: Multilayers, Extreme ultraviolet, Reflectivity, Mirrors, Thin films, Silicon, EUV optics, X-rays, Molybdenum, Sputter deposition

Proceedings Article | 30 April 2009 Paper
P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, E. Meltchakov, C. Hecquet, F. Delmotte, A. Galtayries
Proceedings Volume 7360, 73600O (2009) https://doi.org/10.1117/12.820913
KEYWORDS: Silicon, Aluminum, Silicon carbide, Multilayers, Molybdenum, Ions, Interfaces, X-rays, Reflectivity, Chemical species

Proceedings Article | 3 April 2008 Paper
R. Mercier Ythier, X. Bozec, R. Geyl, A. Rinchet, Christophe Hecquet, Marie-Françoise Ravet-Krill, Franck Delmotte, Benoît Sassolas, Raffaele Flaminio, Jean-Marie Mackowski, Christophe Michel, Jean-Luc Montorio, Nazario Morgado, Laurent Pinard, Elodie Roméo
Proceedings Volume 6921, 692135 (2008) https://doi.org/10.1117/12.787620
KEYWORDS: Reflectivity, Mirrors, Coating, Extreme ultraviolet, Plasma, Manufacturing, Polishing, Annealing, Grazing incidence, Silicon carbide

Proceedings Article | 3 October 2007 Paper
Frédéric Auchère, Marie-Françoise Ravet-Krill, John Moses, Frédéric Rouesnel, Jean-Pierre Moalic, Denis Barbet, Christophe Hecquet, Arnaud Jérome, Raymond Mercier, Jean-Christophe Leclec'h, Franck Delmotte, Jeffrey Newmark
Proceedings Volume 6689, 66890A (2007) https://doi.org/10.1117/12.751447
KEYWORDS: Coronagraphy, Reflectivity, Mirrors, Multilayers, Coating, Extreme ultraviolet, Helium, Solar processes, Rockets, Stray light

Proceedings Article | 20 September 2007 Paper
Proceedings Volume 6689, 66890S (2007) https://doi.org/10.1117/12.731784
KEYWORDS: Extreme ultraviolet, Mirrors, Space telescopes, Sensors, Telescopes, Electronics, Space operations, Thermal modeling, Multilayers, Sun

Proceedings Article | 20 September 2007 Paper
J. Gautier, A. S. Morlens, P. Zeitoun, G. Rey, C. Valentin, E. Papalarazou, J. P. Goddet, S. Sebban, F. Delmotte, M. F. Ravet, F. Bridou
Proceedings Volume 6705, 67050C (2007) https://doi.org/10.1117/12.732424
KEYWORDS: Mirrors, Reflectivity, Holography, Holograms, Multilayers, Silicon, Extreme ultraviolet, Microscopy, Digital holography, X-rays

Proceedings Article | 18 May 2007 Paper
Christophe Hecquet, Marie-Françoise Ravet-Krill, Franck Delmotte, Arnaud Jérôme, Aurélie Hardouin, Françoise Bridou, Françoise Varnière, Marc Roulliay, Frédéric Bourcier, Jean-Michel Desmarres, Vincent Costes, Jacques Berthon, André Rinchet, Roland Geyl
Proceedings Volume 6586, 65860X (2007) https://doi.org/10.1117/12.723483
KEYWORDS: Reflectivity, Extreme ultraviolet, Multilayers, Extreme ultraviolet lithography, Humidity, Annealing, Reflectometry, Silicon carbide, Silicon, Space operations

Proceedings Article | 5 October 2005 Paper
Proceedings Volume 5963, 59631V (2005) https://doi.org/10.1117/12.625031
KEYWORDS: Reflectivity, Mirrors, Multilayers, Silicon, Molybdenum, Sputter deposition, Calibration, Superposition, Extreme ultraviolet, Ion beams

Proceedings Article | 5 October 2005 Paper
Julien Gautier, Franck Delmotte, Marc Roulliay, Marie-Francoise Ravet, Francoise Bridou, Arnaud Jerome, Angelo Giglia, Stefano Nannarone
Proceedings Volume 5963, 59630X (2005) https://doi.org/10.1117/12.625030
KEYWORDS: Reflectivity, Annealing, Multilayers, Reflectometry, Silicon, Sputter deposition, Argon, X-rays, Extreme ultraviolet, Scandium

Proceedings Article | 5 October 2005 Paper
Anne-Sophie Morlens, Marie-Françoise Ravet, Vincent Laude, Rodrigo López-Martens, Marc Roulliay, Arnaud Jérome, Franck Delmotte, Françoise Bridou, Sophie Kazamias, Philippe Balcou, Philippe Zeitoun
Proceedings Volume 5963, 59630W (2005) https://doi.org/10.1117/12.625097
KEYWORDS: Mirrors, Reflectivity, Silicon, Molybdenum, Multilayers, Extreme ultraviolet, Calibration, Reflectometry, Neon, Control systems

Proceedings Article | 25 February 2004 Paper
Marie-Francoise Ravet, Francoise Bridou, Xueyan Zhang-Song, Arnaud Jerome, Franck Delmotte, Raymond Mercier, Marie Bougnet, Philippe Bouyries, Jean-Pierre Delaboudiniere
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.514597
KEYWORDS: Reflectivity, Multilayers, Telescopes, Mirrors, Calibration, Extreme ultraviolet, Reflectometry, Ion beams, Silicon, Reflector telescopes

Proceedings Article | 18 February 2004 Paper
Proceedings Volume 5249, (2004) https://doi.org/10.1117/12.513998
KEYWORDS: Mirrors, Extreme ultraviolet, Telescopes, Optical benches, Coating, Space telescopes, Space operations, Optical filters, Multilayers, Solar processes

Proceedings Article | 4 February 2004 Paper
Jean-Pierre Wuelser, James Lemen, Theodore Tarbell, C. Wolfson, Joseph Cannon, Brock Carpenter, Dexter Duncan, Glenn Gradwohl, Syndie Meyer, Augustus Moore, Rosemarie Navarro, J. Pearson, George Rossi, Larry Springer, Russell Howard, John Moses, Jeffrey Newmark, Jean-Pierre Delaboudiniere, Guy Artzner, Frederic Auchere, Marie Bougnet, Philippe Bouyries, Francoise Bridou, Jean-Yves Clotaire, Gerard Colas, Franck Delmotte, Arnaud Jerome, Michel Lamare, Raymond Mercier, Michel Mullot, Marie-Francoise Ravet, Xueyan Song, Volker Bothmer, Werner Deutsch
Proceedings Volume 5171, (2004) https://doi.org/10.1117/12.506877
KEYWORDS: Mirrors, Telescopes, Space telescopes, Extreme ultraviolet, Charge-coupled devices, Optical filters, Calibration, Coating, Observatories, Sensors

Proceedings Article | 19 December 2003 Paper
James Dunn, Raymond Smith, Sebastian Hubert, Marta Fajardo, Philippe Zeitoun, James Hunter, Christian Remond, Laurent Vanbostal, Sylvie Jacquemot, Joseph Nilsen, Ciaran Lewis, Remy Marmoret, Vyacheslav Shlyaptsev, Marie-Francoise Ravet, Franck Delmotte
Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.504929
KEYWORDS: X-ray lasers, Picosecond phenomena, Visibility, Interferometers, Ions, Palladium, Plasma, Beam splitters, Michelson interferometers, Mirrors

Proceedings Article | 19 December 2003 Paper
Philippe Zeitoun, Philippe Balcou, Samuel Bucourt, Djamel Benredjem, Franck Delmotte, Guillaume Dovillaire, Denis Douillet, James Dunn, G. Faivre, Marta Fajardo, Kenneth Goldberg, Mourad Idir, Sebastien Hubert, Jim Hunter, Sylvie Jacquemot, Sophie Kazamias, Sebastien le Pape, Xavier Levecq, Ciaran Lewis, Remy Marmoret, Pascal Mercere, A. Morlens, Patrick Naulleau, Christian Remond, Jorge Rocca, Stephane Sebban, Raymond Smith, Marie-Francoise Ravet, Philippe Troussel, Constance Valentin, Laurent Vanbostal
Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.508183
KEYWORDS: Wavefronts, X-ray lasers, Wavefront sensors, Extreme ultraviolet, Plasma, Mirrors, Interferometers, Picosecond phenomena, Michelson interferometers, X-ray optics

Showing 5 of 39 publications
Conference Committee Involvement (4)
Advances in Optical Thin Films VIII
8 April 2024 | Strasbourg, France
Advances in Optical Thin Films VII
13 September 2021 | Online Only, Spain
Advances in Optical Thin Films VI
14 May 2018 | Frankfurt, Germany
Advances in Optical Thin Films IV
5 September 2011 | Marseille, France
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