Dr. Fredrik Eriksson Profile

Dr. Fredrik Eriksson

at Linköping Univ.

SPIE Involvement:

Conference Program Committee | Author

Publications (7)

Proceedings Article | 4 October 2024 Presentation

Presentation

Improved performance of polarizing Fe/Si multilayer neutron optics by 11B4C incorporation

Fredrik Eriksson, Anton Zubayer, Naureen Ghafoor, Kristbjörg Thorarinsdottir, Sjoerd Stendahl, Artur Glavic, Jochen Stahn, Gyula Nagy, Grzegorgz Greczynski, Matthias Schwartzkopf, Arnaud Le Febvrier, Per Eklund, Fridrik Magnus, Jens Birch

Proceedings Volume PC13150, PC1315003 (2024) https://doi.org/10.1117/12.3029654

KEYWORDS: Scattering, Reflectivity, Polarization, Magnetism, X-rays, Vibration, Sputter deposition, Polarization density, Optical limiting, Materials science

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Proceedings Article | 21 September 2018 Presentation + Paper

Presentation + Paper

Ion-assisted magnetron sputter deposition of B4C-doped Ni/Ti multilayer mirrors

Fredrik Eriksson, Naureen Ghafoor, Daniel Ostach, Norbert Schell, Jens Birch

Proceedings Volume 10760, 1076006 (2018) https://doi.org/10.1117/12.2317742

KEYWORDS: Reflectivity, Interfaces, X-rays, Multilayers, Mirrors, Sputter deposition, Modulation, Ions, Doping, Scattering

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Proceedings Article | 8 September 2005 Paper

Paper

Stability of EUV multilayers to long-term heating, and to energetic protons and neutrons, for extreme solar missions

A. Rousseau, D. Windt, B. Winter, L. Harra, H. Lamoureux, F. Eriksson

Proceedings Volume 5900, 590004 (2005) https://doi.org/10.1117/12.616469

KEYWORDS: Multilayers, Extreme ultraviolet, Annealing, Reflectivity, Sun, X-rays, Remote sensing, Particles, Telescopes, Thermal modeling

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Proceedings Article | 14 October 2004 Paper

Paper

Measurements of the optical constants of scandium in the 50-1300eV range

Andrew Aquila, Farhad Salmassi, Eric Gullikson, Fredrik Eriksson, Jens Birch

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.563615

KEYWORDS: Scandium, Reflectivity, Absorption, X-rays, Multilayers, Optical testing, Mirrors, Silicon, Refraction, Extreme ultraviolet

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SPIE Journal Paper | 1 November 2002

Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition

Fredrik Eriksson, Goeran Johansson, Hans Hertz, Jens Birch

OE, Vol. 41, Issue 11, (November 2002) https://doi.org/10.1117/12.10.1117/1.1510750

KEYWORDS: Reflectivity, Ions, X-rays, Interfaces, Argon, Chromium, Hard x-rays, Plasma, Sputter deposition, Mirrors

Proceedings Article | 20 December 2001 Paper

Paper

Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition

Fredrik Eriksson, Goeran Johansson, Hans Hertz, Jens Birch

Proceedings Volume 4506, (2001) https://doi.org/10.1117/12.450948

KEYWORDS: Ions, Reflectivity, X-rays, Interfaces, Argon, Multilayers, Plasma, Hard x-rays, Chromium, Sputter deposition

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Proceedings Article | 2 November 2000 Paper

Paper

Accurate multilayer period determination with laser plasma water-window reflectometer

Goeran Johansson, Magnus Berglund, Fredrik Eriksson, Jens Birch, Hans Hertz

Proceedings Volume 4144, (2000) https://doi.org/10.1117/12.405907

KEYWORDS: Reflectometry, Mirrors, X-rays, Multilayers, Error analysis, Data analysis, X-ray detectors, Computing systems, Reflection, Reflectivity

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Showing 5 of 7 publications

Conference Committee Involvement (3)

Advances in X-Ray/EUV Sources, Optics, and Components XX

3 August 2025 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIX

19 August 2024 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVIII

22 August 2023 | San Diego, California, United States

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