Dr. Gaurav Dwivedi Profile

Dr. Gaurav Dwivedi

at National Institute of Technology Delhi

SPIE Involvement:

Author

Area of Expertise:

Digital holography , interferometry , nondestructive testing , schlieren , numerical reconstruction , hologram

Publications (1)

SPIE Journal Paper | 27 March 2020

Delamination testing of polyurethane pads adhered to polishing tool using a digital holographic nondestructive testing method

Gaurav Dwivedi, Anuj Sharma, Omendra Singh, Prabhat Baghel, Raj Kumar

OE, Vol. 59, Issue 10, 102417, (March 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.10.102417

KEYWORDS: Polishing, Surface finishing, Digital holography, Polyurethane, Holograms, Digital recording, Glasses, Holography, Precision optics, Optical engineering

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