Dr. Gil Abramovich Profile

Dr. Gil Abramovich

Senior Researcher

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Author

Publications (19)

Proceedings Article | 2 May 2018 Paper

Backside illuminated CMOS-TDI line scan sensor for space applications

Omer Cohen, Oren Ofer, Gil Abramovich, Nimrod Ben-Ari, Gal Gershon, Maya Brumer, Adi Shay, Yaron Shamay

Proceedings Volume 10641, 106410R (2018) https://doi.org/10.1117/12.2304511

KEYWORDS: Sensors, CMOS sensors, Image sensors, Sun, Silicon, Line scan sensors, Optical filters, Space sensors, Earth observing sensors, Line scan image sensors, Back illuminated sensors, Multispectral imaging

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Proceedings Article | 19 February 2013 Paper

A single lens with no moving parts for rapid high-resolution 3D image capture

Dan Gray, Hongquiang Chen, Joseph Czechowski, Kang Zhang, Jilin Tu, Frederick Wheeler, Masako Yamada, Juan Pablo Cilia, Russell DeMuth, Esmaeil Heidari, Gil Abramovich, Kevin Harding

Proceedings Volume 8659, 86590N (2013) https://doi.org/10.1117/12.2001449

KEYWORDS: 3D image processing, Imaging systems, Cameras, Lens design, Modulation transfer functions, Image resolution, 3D image reconstruction, 3D metrology, 3D modeling, Structured light

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Proceedings Article | 15 May 2012 Paper

Visual tools for human guidance in manual operations

Kevin Harding, Gil Abramovich

Proceedings Volume 8384, 83840V (2012) https://doi.org/10.1117/12.918601

KEYWORDS: Visualization, Cameras, Video, Imaging systems, Direct methods, Computer simulations, 3D image processing, Sensors, Eye, Visible radiation

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Proceedings Article | 14 September 2011 Paper

Automated 3D IR defect mapping system for CZT wafer and tile inspection and characterization

Yi Liao, Esmaeil Heidari, Gil Abramovich, Christopher Nafis, Amer Butt, Joseph Czechowski, Kevin Harding, J. Eric Tkaczyk

Proceedings Volume 8133, 81330P (2011) https://doi.org/10.1117/12.892765

KEYWORDS: Semiconducting wafers, Infrared imaging, Inspection, Sensors, Associative arrays, Wafer inspection, 3D image processing, Neodymium, Crystals, Ions

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Proceedings Article | 30 August 2011 Paper

Submicron feature surface mapping interferometer for hard-to-access locations

Gil Abramovich, Kevin Harding

Proceedings Volume 8133, 813303 (2011) https://doi.org/10.1117/12.891724

KEYWORDS: Interferometers, Imaging systems, Interferometry, Mirrors, Relays, Ions, Inspection, Spatial resolution, Microscopes, Cameras

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Proceedings Article | 20 May 2011 Paper

Application issues in the use of depth from (de)focus analysis methods

M. Daneshpanah, G. Abramovich, K. Harding, A. Vemury

Proceedings Volume 8043, 80430G (2011) https://doi.org/10.1117/12.886271

KEYWORDS: Imaging systems, Point spread functions, Image analysis, Convolution, Sensors, 3D image processing, 3D modeling, Stereoscopy, Analytical research, 3D metrology

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Proceedings Article | 17 May 2011 Paper

LED eye safety considerations in the design of iris capture systems

Gil Abramovich, Frederick Wheeler

Proceedings Volume 8029, 80291X (2011) https://doi.org/10.1117/12.883668

KEYWORDS: Light emitting diodes, Eye, Safety, Iris, Retina, Near infrared, Iris recognition, Cornea, Laser safety, Cameras

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Proceedings Article | 11 November 2010 Paper

A hand-held triangulation sensor for small features measurement

Gil Abramovich, Kevin Harding

Proceedings Volume 7855, 78550F (2010) https://doi.org/10.1117/12.872460

KEYWORDS: Phase shifts, Sensors, Calibration, Cameras, Projection systems, Fringe analysis, Phase shifting, Imaging systems, Mirrors, Image filtering

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Proceedings Article | 3 September 2010 Paper

Dual-illumination NIR system for wafer level defect inspection

Yana Williams, Kevin Harding, Gil Abramovich, Christopher Nafis, Eric Tkaczyk, Kristian Andreini, Henry Chen, Glenn Bindley

Proceedings Volume 7793, 77930I (2010) https://doi.org/10.1117/12.861038

KEYWORDS: Semiconducting wafers, Imaging systems, Light sources and illumination, Tellurium, Cameras, Inspection, Manufacturing, Near infrared, Sensors, Light scattering

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Proceedings Article | 3 September 2010 Paper

CZT smart dicing strategy for cost reduction using defect imaging and random-access machining

J. Eric Tkaczyk, Kristian Andreini, Tan Zhang, Kevin Harding, Gil Abramovich, Yana Williams, Christopher Nafis, Wenwu Zhang

Proceedings Volume 7806, 78060L (2010) https://doi.org/10.1117/12.865861

KEYWORDS: Sensors, Semiconducting wafers, Crystals, Image segmentation, Infrared imaging, Inspection, Laser cutting, 3D image processing, Ultrasonography, Image processing

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Proceedings Article | 5 May 2010 Paper

3D imaging system for biometric applications

Kevin Harding, Gil Abramovich, Vijay Paruchura, Swaminathan Manickam, Arun Vemury

Proceedings Volume 7690, 76900J (2010) https://doi.org/10.1117/12.850872

KEYWORDS: Cameras, Imaging systems, 3D image processing, 3D metrology, Image resolution, Avionic systems, Biometrics, LIDAR, Phase shifting, Structured light

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Proceedings Article | 28 April 2010 Paper

A spoof detection method for contactless fingerprint collection utilizing spectrum and polarization diversity

Gil Abramovich, Meena Ganesh, Kevin Harding, Swaminathan Manickam, Joseph Czechowski, Xinghua Wang, Arun Vemury

Proceedings Volume 7680, 768005 (2010) https://doi.org/10.1117/12.851375

KEYWORDS: Polarization, Continuous wavelet transforms, Imaging systems, Polarizers, Information operations, Skin, Multispectral imaging, Wavelet transforms, Fourier transforms, Wavelets

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Proceedings Article | 26 April 2010 Paper

A comparative study of four change detection methods for aerial photography applications

Gil Abramovich, Glen Brooksby, Stephen Bush, Swaminathan Manickam, Ozge Ozcanli, Benjamin Garrett

Proceedings Volume 7668, 76680M (2010) https://doi.org/10.1117/12.852195

KEYWORDS: Probability theory, 3D modeling, Magnetorheological finishing, Photography, Image processing, Image segmentation, Detection and tracking algorithms, Algorithms, Light sources and illumination, Intelligence systems

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Proceedings Article | 14 April 2010 Paper

Mobile, contactless, single-shot, fingerprint capture system

Gil Abramovich, Kevin Harding, Swaminathan Manickam, Joseph Czechowski, Vijay Paruchuru, Robert Tait, Christopher Nafis, Arun Vemury

Proceedings Volume 7667, 766708 (2010) https://doi.org/10.1117/12.850708

KEYWORDS: Cameras, Polarization, 3D image processing, Image fusion, Refractive index, Image registration, Liquid crystals, Sensors, Data modeling, 3D modeling

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Proceedings Article | 10 September 2009 Paper

Real-time 3D part metrology using polarization rotation

Gil Abramovich, Kevin Harding, Vijay Paruchuru, Swaminathan Manickam, Christopher Nafis, Joseph Czechowski, Arun Vemury

Proceedings Volume 7432, 743212 (2009) https://doi.org/10.1117/12.828805

KEYWORDS: Lenses, Cameras, Polarization, 3D metrology, 3D image processing, Image quality, Metrology, Calcite, Beam splitters, Imaging systems

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Proceedings Article | 10 September 2009 Paper

Three-dimensional embedded defect detection and localization in a semi-transparent medium

Gil Abramovich, Christopher Nafis, Yana Williams, Kevin Harding, Eric Tkaczyk

Proceedings Volume 7432, 74321C (2009) https://doi.org/10.1117/12.830444

KEYWORDS: Cameras, Defect detection, Signal to noise ratio, Imaging systems, Sensors, 3D metrology, 3D image processing, Interference (communication), Image analysis, Detection and tracking algorithms

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Proceedings Article | 29 August 2008 Paper

Camera-based 10KHz distance gage

Gil Abramovich, Kevin Harding

Proceedings Volume 7066, 70660G (2008) https://doi.org/10.1117/12.791924

KEYWORDS: Cameras, Sensors, Imaging systems, Line scan image sensors, Reflection, Semiconductor lasers, Image segmentation, Field programmable gate arrays, Image analysis, Diffraction

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Proceedings Article | 10 October 2007 Paper

Hybrid interferometric structured light method for surface mapping

Kevin Harding, Gil Abramovich

Proceedings Volume 6762, 67620F (2007) https://doi.org/10.1117/12.735676

KEYWORDS: Interferometry, Interferometers, Phase shifts, Mirrors, Surface finishing, Fringe analysis, Laser interferometry, Phase shifting, Cameras, Structured light

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Proceedings Article | 13 October 2006 Paper

Image enhancement for phase shift analysis sensors

Gil Abramovich, Kevin Harding, Ralph Isaacs, Matthew Radebach, Kevin Kenny, Zhaohui Sun, Joe Ross, Ming Jia, Li Tao, Guiju Song, Jianming Zheng, Martha Gardner, Dirk Padfield

Proceedings Volume 6382, 63820Q (2006) https://doi.org/10.1117/12.686354

KEYWORDS: Detection and tracking algorithms, Gaussian filters, Image enhancement, Phase shifts, Image filtering, Sensors, Image analysis, Edge detection, Anisotropic filtering, Speckle

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Showing 5 of 19 publications

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