Dr. Gordon Schmidt Profile

Dr. Gordon Schmidt

at Otto-von-Guericke-University Magdeburg

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 12 March 2024 Presentation

Advanced nano-characterization of an AlInN/GaN-based photonic bandgap crystal laser structure

Frank Bertram, Gordon Schmidt, Christoph Berger, Peter Veit, Jürgen Bläsing, Armin Dadgar, André Strittmatter, Juergen Christen

Proceedings Volume PC12880, PC1288005 (2024) https://doi.org/10.1117/12.3000941

KEYWORDS: Photonic crystals, Laser crystals, Crystals, Gallium nitride, Waveguides, Waveguide lasers, Superlattices, Scanning electron microscopy, Quantum wells, Quantum processes

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Proceedings Article | 9 March 2024 Presentation

Nano-cathodoluminescence of GaN based power-devices

Gordon Schmidt, Frank Bertram, Jürgen Christen

Proceedings Volume PC12886, PC128860M (2024) https://doi.org/10.1117/12.3000517

KEYWORDS: Gallium nitride, Excitons, Luminescence, Silicon, Scanning electron microscopy, Vapor phase epitaxy, Transistors, Signal intensity, Semiconductors, Scanning transmission electron microscopy

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Proceedings Article | 21 March 2023 Presentation

Optical and structural nano-characterization of GaN-based power devices

Jürgen Christen, Gordon Schmidt, Frank Bertram, Arne Debald, Michael Heuken, Thorsten Zweipfennig, Holger Kalisch, Andrei Vescan

Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2649840

KEYWORDS: Luminescence, Spectroscopes, Scanning transmission electron microscopy, Gallium nitride, Excitons, Visualization, Transistors, Spatial resolution, Semiconductors, Scanning electron microscopy

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Proceedings Article | 21 March 2023 Presentation

Nano-characterization of a space-charge region in a pn-diode with long drift layer: detailed cathodoluminescence and EBIC correlation

Konstantin Wein, Frank Bertram, Gordon Schmidt, Peter Veit, Jürgen Christen, Samuel Faber, Bernd Witzigmann, Michael Heuken, Thorsten Zweipfenning, Holger Kalisch, Andrei Vescan, Arne Debald

Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2646670

KEYWORDS: Gallium nitride, Temperature metrology, Luminescence, Diffusion, Visualization, Spatial resolution, Scanning electron microscopy, Line scan image sensors, Excitons, Electron microscopes

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Proceedings Article | 20 March 2023 Presentation

Vertical and lateral carrier transport into InP quantum dots of a membrane external-cavity surface-emitting laser structure

Gordon Schmidt, Frank Bertram, Peter Veit, Julie Kernchen, Jürgen Christen, Ana Ćutuk, Michael Jetter, Peter Michler

Proceedings Volume PC12415, PC1241506 (2023) https://doi.org/10.1117/12.2649915

KEYWORDS: Quantum dots, Spectroscopy, Line scan image sensors, Cladding, Visualization, Spatial resolution, Scanning electron microscopy, Imaging spectroscopy, Epitaxy, Electron microscopes

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Proceedings Article | 13 March 2019 Presentation

Probing the homogeneity of an In-rich InGaN layer by nanoscale cathodoluminescence (Conference Presentation)

Bowen Sheng, Xiantong Zheng, Gordon Schmidt, Peter Veit, Ping Wang, Frank Bertram, Zhaoying Chen, Jürgen Christen, Bo Shen, Xinqiang Wang

Proceedings Volume 10918, 109180L (2019) https://doi.org/10.1117/12.2511006

KEYWORDS: Indium gallium nitride, Indium, Scanning electron microscopy, Optoelectronic devices, Gallium nitride, Atomic force microscope, Atomic force microscopy, Luminescence

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Proceedings Article | 4 March 2019 Presentation

Nanometer scale cathodoluminescence of GaN quantum-dots on a wavelength-matched deep-UV distributed Bragg reflector (Conference Presentation)

Hannes Schuermann, Gordon Schmidt, Christoph Berger, Sebastian Metzner, Peter Veit, Jürgen Bläsing, Frank Bertram, Armin Dadgar, André Strittmatter, Jürgen Christen, Stefan Kalinowski, Gordon Callsen, Stefan Jagsch, Markus Wagner, Axel Hoffmann

Proceedings Volume 10929, 109290A (2019) https://doi.org/10.1117/12.2510350

KEYWORDS: Vapor phase epitaxy, Gallium nitride, Deep ultraviolet, Distributed Bragg reflectors, Quantum dots, Reflectivity, Epitaxy, Single photon, Absorption, Gallium

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Proceedings Article | 14 March 2018 Presentation

Investigation of desorption-induced GaN quantum-dot formation using cathodoluminescence microscopy (Conference Presentation)

Gordon Schmidt, Hannes Schürmann, Sebastian Metzner, Peter Veit, Frank Bertram, Christoph Berger, Jürgen Bläsing, Armin Dadgar, André Strittmatter, Jürgen Christen

Proceedings Volume 10532, 105320N (2018) https://doi.org/10.1117/12.2290737

KEYWORDS: Gallium nitride, Quantum dots, Scanning electron microscopy, Electron microscopes, Metals, Vapor phase epitaxy, Scanning transmission electron microscopy, Microscopy, Ultraviolet radiation, Single photon

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Proceedings Article | 14 March 2018 Presentation

Nanoscopic insights into the structural and optical properties of a thick InGaN shell grown coaxially on GaN microrod (Conference Presentation)

Frank Bertram, Marcus Mueller, Gordon Schmidt, Sebastian Metzner, Peter Veit, Juergen Christen, Jana Hartmann, Hao Zhou, H.H. Wehmann, Andreas Waag

Proceedings Volume 10532, 105321E (2018) https://doi.org/10.1117/12.2288262

KEYWORDS: Indium gallium nitride, Gallium nitride, Luminescence, Electron microscopes, Scanning transmission electron microscopy, Optical properties, Nanorods, Metals, Vapor phase epitaxy, Scanning electron microscopy

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Proceedings Article | 5 October 2015 Presentation

Simultaneous optical and structural investigation of nanomaterials and nanostructures for LEDs (Presentation Recording)

Marcus Mueller, Frank Bertram, Gordson Schmidt, Jürgen Christen

Proceedings Volume 9553, 95530D (2015) https://doi.org/10.1117/12.2189907

KEYWORDS: Nanorods, Light emitting diodes, Nanomaterials, Nanostructures, Optoelectronic devices, Gallium nitride, Crystals, Optical properties, Crystallography, Scanning electron microscopy

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Showing 5 of 10 publications

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