Prof. Haiping Shen Profile

Prof. Haiping Shen

Lecturer at Fudan Univ

SPIE Involvement:

Author

Area of Expertise:

Lighting , Light source reliability , Metrology

Haiping Shen received his Bachelor’s degree in 2003 and Ph.D. in 2008 in optical engineering from Zhejiang University. During his graduate student period, he spent four years in the research on LED metrology in Everfine Company. He is now working in the department of Light Sources & Illuminating Engineering, Fudan University. His research interest is in the photometric and colorimetric metrology, and reliability analysis for light sources, especially LED light sources. He has published 40 papers and given 10 conference presentations.

Proceedings Article | 20 September 2020 Presentation + Paper

Design of x-ray backscatter imaging system for vehicle detection

Baolu Yang, Xin Wang, Haiping Shen, Jie Xu, Kai Xiong, Baozhong Mu

Proceedings Volume 11542, 115420L (2020) https://doi.org/10.1117/12.2571044

KEYWORDS: X-rays, Backscatter, X-ray imaging, Imaging systems, Explosives, Inspection, Image processing, Signal processing, Digital image processing, Weapons

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Proceedings Article | 15 October 2012 Paper

Measurement method for the transition width of precision approach path indicator based on spectral means

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Jiangen Pan, Muqing Liu

Proceedings Volume 8417, 841743 (2012) https://doi.org/10.1117/12.980254

KEYWORDS: Spectroscopy, Distance measurement, Lamps, Light emitting diodes, Optical testing, Light sources, Digital imaging, Image processing, Charge-coupled devices, Stray light

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Proceedings Article | 15 October 2012 Paper

Uncertainty analysis in lifetime measurement for white light emitting diodes

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Muqing Liu

Proceedings Volume 8484, 84840A (2012) https://doi.org/10.1117/12.930579

KEYWORDS: Light emitting diodes, Uncertainty analysis, Time metrology, Optical testing, Solid state lighting, Accelerated life testing, Illumination engineering, Temperature metrology, Reliability, Sensors

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SPIE Journal Paper | 18 July 2012

Pulse modulation effect of light-emitting diodes on human perception enhancement

Gu Xin, Weixi Gao, Haiping Shen, Muqing Liu

OE, Vol. 51, Issue 7, 073608, (July 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.7.073608

KEYWORDS: Light emitting diodes, Modulation, Pulsed laser operation, Optical filters, Lamps, Optical engineering, Photodiodes, Temperature metrology, Light sources, Ranging

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Proceedings Article | 12 January 2011 Paper

Dependence of reliability of GaN LEDs on their junction temperatures and ideal factors

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Muqing Liu

Proceedings Volume 7991, 799104 (2011) https://doi.org/10.1117/12.888644

KEYWORDS: Light emitting diodes, Temperature metrology, Reliability, Gallium nitride, Blue light emitting diodes, Accelerated life testing, Epoxies, Light sources, Illumination engineering, Manufacturing

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Proceedings Article | 28 December 2010 Paper

Uncertainty analysis in measurement for LED junction temperature and thermal resistance

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Muqing Liu

Proceedings Volume 7544, 75446J (2010) https://doi.org/10.1117/12.885290

KEYWORDS: Temperature metrology, Light emitting diodes, Resistance, Calibration, Uncertainty analysis, Standards development, Temperature sensors, Light sources, Solid state lighting, Reliability

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Proceedings Article | 16 November 2010 Paper

Design of precision approach path indicator with LEDs as its light sources

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Jiangen Pan, Muqing Liu

Proceedings Volume 7852, 78520D (2010) https://doi.org/10.1117/12.870416

KEYWORDS: Light emitting diodes, Lamps, Light sources, Halogens, Optical simulations, Optical design, Light, Computer aided design, Reliability, Luminous efficiency

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Proceedings Article | 4 January 2008 Paper

Accelerated life test for high-power white LED based on spectroradiometric measurement

Haiping Shen, Jiangen Pan, Huajun Feng

Proceedings Volume 6841, 684104 (2008) https://doi.org/10.1117/12.755708

KEYWORDS: Light emitting diodes, Accelerated life testing, Reliability, Luminous efficacy, Spectroscopy, Photometry, Head, LED lighting, Light sources, Lamps

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