Mr. Hao Xu Profile

Hao Xu

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 18 November 2019 Paper

Single-shot 3D shape measurement with spatial frequency multiplexing using deep learning

Chen Yang, Wei Yin, Hao Xu, Jiachao Li, Shijie Feng, Tianyang Tao, Qian Chen, Chao Zuo

Proceedings Volume 11189, 111891P (2019) https://doi.org/10.1117/12.2537732

KEYWORDS: Fringe analysis, 3D metrology, Neural networks, Phase measurement, Spatial frequencies, Multiplexing, Phase shifts, Fourier transforms, Electroluminescent displays, Composites

Read Abstract +

In this paper, we propose a single-shot 3D shape measurement with spatial frequency multiplexing using deep learning. Fourier transform profilometry (FTP) is highly suitable for dynamic 3D acquisition and can provide the phase map using a single fringe pattern. However, it suffers from the spectrum overlapping problem which limits its measurement quality and precludes the recovery of the fine details of complex surfaces. Furthermore, FTP adopts the arctangent function ranging between -π and Π for phase calculation, which results in phase ambiguities in the wrapped phase map with 2π phase jumps. Inspired by deep learning techniques, in this study, we use a deep neural network to extract the phase information of the object from one deformed fringe pattern. Meanwhile, we design a dual-frequency fringe pattern with spatial frequency multiplexing to eliminate the phase ambiguities. Therefore, an absolute phase map can be obtained without projecting any additional patterns. The experimental results demonstrate that the single-shot 3D measurement method based on deep learning techniques can effectively realize the absolute 3D measurement with one fringe image and improve the measurement accuracy compared with the traditional Fourier transform profilometry.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years