Mr. Heiko Breede Profile

Heiko Breede

at DESY

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 3 May 2013 Paper

A new compact design of a three-dimensional Ionization Profile Monitor (IPM)

Heiko Breede, Hans-Jürgen Grabosch, Martin Sachwitz

Proceedings Volume 8778, 87781C (2013) https://doi.org/10.1117/12.2021367

KEYWORDS: Ions, Microchannel plates, Free electron lasers, Sensors, Particles, Ionization, Video, Computer aided design, X-ray lasers, Beam shaping

Read Abstract +

The Free Electron Laser FLASH at the German Electron Synchrotron (DESY) in Hamburg is a linear accelerator, which uses superconducting technology to produce soft x-ray laser light ranging from 4,1 to 45 nm. To ensure the operation stability of FLASH, monitoring of the beam is mandatory. Among various detectors located at the beam pipe, two Ionization Profile Monitors (IPM) detect the lateral x and y position changes. The functional principle of the IPM is based on the detection of electrons, generated by interaction of the photon beam with the residual gas in the beam line. The newly designed IPM enables the combined determination of the FEL’s horizontal and vertical position as well as the beam’s profile. This is made possible by a compact monitor, consisting of a cage in a vacuum chamber, two microchannel plates (MCP) and two structural repeller plates with toggled electric fields at the opposite sides of the MCPs. The electrons created by the FEL beam, drift in a homogenous electrical field towards the respective micro-channel plate, which produces an image of the beam profile on an attached phosphor screen. A CCD camera for each MCP in combination with a computer is used for the evaluation. This indirect detection scheme operates over a wide dynamic range and allows the detection of the center of gravity and the shape of the photon beam without affecting the FEL beam. Exact knowledge of the path taken by the electrons permits a recursive determination of the beam position. Within a beam variance of less than 10 mm, an accuracy better than ±8 um seems to be possible.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years