Hiroya Yamaguchi
Graduate Student at Kyoto Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 26 October 2007 Paper
M. Bautz, B. LaMarr, E. Miller, S. Kissel, G. Prigozhin, B. Burke, J. Gregory, H. Uchiyama, Y. Hyodo, H. Yamaguchi, H. Mori, T. Tsuru, H. Matsumoto, K. Koyama, K. Torii, S. Katsuda, K. Hasuike, H. Nakajima, K. Hayashida, H. Tsunemi, H. Murakami, M. Ozaki, T. Dotani
Proceedings Volume 6686, 66860Q (2007) https://doi.org/10.1117/12.734094
KEYWORDS: Sensors, Spectral resolution, Charge-coupled devices, Bismuth, X-rays, Radiation effects, Back illuminated sensors, X-ray imaging, Particles, Calibration

Proceedings Article | 13 September 2007 Paper
Hideki Uchiyama, Yoshiaki Hyodo, Hiroya Yamaguchi, Hiroshi Nakajima, Hideyuki Mori, Takeshi Go Tsuru, Hironori Matsumoto, Katsuji Koyama, Ken'ichi Torii, Satoru Katsuda, Kazuto Hasuike, Kiyoshi Hayashida, Hiroshi Tsunemi, Hiroshi Murakami, Tadayasu Dotani, Gregory Prigozhin, Steve Kissel, Eric Miller, Beverly LaMarr, Marshall Bautz
Proceedings Volume 6686, 66860P (2007) https://doi.org/10.1117/12.733689
KEYWORDS: Calibration, Charge-coupled devices, X-rays, Iron, Sensors, Manganese, Bismuth, X-ray imaging, Satellites, Image segmentation

Proceedings Article | 15 June 2006 Paper
Proceedings Volume 6266, 626641 (2006) https://doi.org/10.1117/12.671033
KEYWORDS: X-rays, Charge-coupled devices, Silicon, Bismuth, Photons, Iron, X-ray imaging, Sensors, Calibration, Spectroscopy

Proceedings Article | 15 June 2006 Paper
H. Yamaguchi, H. Nakajima, K. Koyama, T. Tsuru, H. Matsumoto, N. Tawa, H. Tsunemi, K. Hayashida, K. Torii, M. Namiki, H. Katayama, T. Dotani, M. Ozaki, H. Murakami, E. Miller
Proceedings Volume 6266, 626642 (2006) https://doi.org/10.1117/12.672183
KEYWORDS: Charge-coupled devices, X-rays, Bismuth, Calibration, Sensors, Satellites, X-ray imaging, Quantum efficiency, Aluminum, Solids

Proceedings Article | 11 October 2004 Paper
Proceedings Volume 5488, (2004) https://doi.org/10.1117/12.550831
KEYWORDS: Sensors, X-rays, Calibration, Charge-coupled devices, Quantum efficiency, Iron, CCD image sensors, Bismuth, CCD cameras, Silicon

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