Hongqin Zhang
Staff Engineer
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 17 October 2008 Paper
Proceedings Volume 7122, 71221B (2008) https://doi.org/10.1117/12.801945
KEYWORDS: Photomasks, Inspection, Semiconducting wafers, Finite-difference time-domain method, Wafer inspection, Manufacturing, Printing, Lithography, Reticles, Optical proximity correction

Proceedings Article | 14 February 2008 Paper
Proceedings Volume 6806, 68060N (2008) https://doi.org/10.1117/12.766703
KEYWORDS: Visualization, Visual process modeling, Principal component analysis, Image visualization, Contrast sensitivity, RGB color model, Feature extraction, Hyperspectral imaging, Visual system, Statistical modeling

Proceedings Article | 4 May 2006 Paper
Proceedings Volume 6233, 62330X (2006) https://doi.org/10.1117/12.665696
KEYWORDS: Independent component analysis, Principal component analysis, Visualization, Hyperspectral imaging, RGB color model, Associative arrays, Human vision and color perception, Color vision, Sensors, Colorimetry

Proceedings Article | 19 August 1998 Paper
Xiaoyu Ma, Qing Cao, Shutang Wang, Liang Guo, Zhongming Wang, Liming Wang, Guangping He, Yali Yang, Hongqin Zhang, Xiuning Zhou, Lianhui Chen
Proceedings Volume 3547, (1998) https://doi.org/10.1117/12.319615
KEYWORDS: Metalorganic chemical vapor deposition, Quantum wells, Semiconductor lasers, Laser damage threshold, Continuous wave operation, Hydrogen, Heterojunctions, Active optics, Cladding, Coating

Proceedings Article | 19 August 1998 Paper
Xiaoyu Ma, Qing Cao, Shutang Wang, Liang Guo, Liming Wang, Yali Yang, Hongqin Zhang, Xiaoyan Zhang, Lianhui Chen
Proceedings Volume 3547, (1998) https://doi.org/10.1117/12.319602
KEYWORDS: Semiconductor lasers, Digital video discs, Quantum wells, Aluminium gallium indium phosphide, Metalorganic chemical vapor deposition, Cladding, Laser damage threshold, Waveguides, Continuous wave operation

Showing 5 of 7 publications
Conference Committee Involvement (2)
Image Quality and System Performance IX
24 January 2012 | Burlingame, California, United States
Image Quality and System Performance VIII
24 January 2011 | San Francisco Airport, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top