Dr. Hsueh-Mei W. Graham
Lockheed Martin Fellow
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 29 August 2008 Paper
Proceedings Volume 7065, 706508 (2008) https://doi.org/10.1117/12.796507
KEYWORDS: Reflectivity, Temperature metrology, Sensors, FT-IR spectroscopy, High dynamic range imaging, Mirrors, Reflectometry, Signal detection, Aluminum, Data modeling

Proceedings Article | 14 November 2003 Paper
H. Graham, Harris Carter
Proceedings Volume 5192, (2003) https://doi.org/10.1117/12.503522
KEYWORDS: High dynamic range imaging, Reflection, Mirrors, Thin films, Polymer thin films, Absorption, Polymers, Spatial resolution, Reflectometry, Computer simulations

Conference Committee Involvement (6)
Reflection, Scattering, and Diffraction from Surfaces IV
17 August 2014 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces III
14 August 2012 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces II
2 August 2010 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces
11 August 2008 | San Diego, California, United States
Optical Diagnostics
3 August 2005 | San Diego, California, United States
Showing 5 of 6 Conference Committees
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