Mr. Ida Bagus Gede Putra Pratama Profile

Ida Bagus Gede Putra Pratama

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 4 March 2015 Paper

Quality inspection on electrolytic capacitors using micro-computed tomography

I. B. G. Pratama, Gede Suparta

Proceedings Volume 9302, 93020L (2015) https://doi.org/10.1117/12.2076911

KEYWORDS: Capacitors, Inspection, X-rays, Signal attenuation, Radiography, Tomography, Aluminum, Sensors, Physics, X-ray imaging

Read Abstract +

A set of electrolyte capacitors were inspected using x-ray micro-computed tomography (μ-CT) system developed at the Department of Physics Gadjah Mada University, Indonesia. Testing was done for three electrolyte capacitors. The one is in good condition and the other two are considered broken. Those were broken due to either high voltage operation or leakage of the tube. Under customized μ-CT inspection, 3-D presentations of the objects have been developed. The results showed that the image profiles, radiation attenuation profiles and linear attenuation coefficient distribution on top, middle and bottom area were able to determine the aluminum plate and electrolyte papers. Good electrolyte capacitor has higher radiation attenuation and nearly uniform across the core of the capacitor. This is in contrast with the broken capacitors.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years