Dr. Iris Erichsen Profile

Dr. Iris Erichsen

Developer at TRIOPTICS GmbH

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Author

Publications (7)

Proceedings Article | 7 February 2012 Paper

Surface topography and optical performance measurement of microlenses used in high power VCSEL systems

I. Erichsen, S. Krey

Proceedings Volume 8276, 82760C (2012) https://doi.org/10.1117/12.908130

KEYWORDS: Microlens array, Optical properties, Reflection, Lenses, Sensors, Wavefront sensors, Wavefronts, Microlens, Vertical cavity surface emitting lasers, Optics manufacturing

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Proceedings Article | 14 May 2010 Paper

A deflectometric sensor for the on-machine surface form measurement and adaptive manufacturing

Stefan Krey, Iris Erichsen, Ilka Mahns, Wim van Amstel, Karl Vielhaber

Proceedings Volume 7718, 77180C (2010) https://doi.org/10.1117/12.854643

KEYWORDS: Optical spheres, Sensors, Error analysis, Manufacturing, Kinematics, Deflectometry, Aspheric lenses, Reconstruction algorithms, Spherical lenses, Optics manufacturing

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Proceedings Article | 24 February 2010 Paper

Characterization of intraocular lenses: a comparison of different measurement methods

M. Cherrier, I. Erichsen, S. Krey

Proceedings Volume 7556, 75560W (2010) https://doi.org/10.1117/12.843665

KEYWORDS: Monochromatic aberrations, Point spread functions, Eye, Cornea, Wavefront sensors, Wavefronts, CCD cameras, Modulation transfer functions, Intraocular lenses, Eye models

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Proceedings Article | 29 August 2008 Paper

High resolution wavefront measurement of aspheric optics

I. Erichsen, S. Krey, J. Heinisch, A. Ruprecht, E. Dumitrescu

Proceedings Volume 7060, 70600T (2008) https://doi.org/10.1117/12.794467

KEYWORDS: Wafer-level optics, Light sources, Sensors, Wavefront sensors, Wavefronts, Optical testing, Aspheric optics, Aspheric lenses, Modulation transfer functions, Semiconducting wafers

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Proceedings Article | 25 April 2008 Paper

Ultra-fast wavefront analyser for high volume production of camera modules lenses

M. Cherrier, I. Erichsen, A. Ruprecht, S. Krey

Proceedings Volume 6995, 699512 (2008) https://doi.org/10.1117/12.781433

KEYWORDS: Microscopes, Telescopes, Light sources, Lenses, Sensors, Wavefront sensors, Wavefronts, Objectives, Modulation transfer functions, Semiconducting wafers

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Proceedings Article | 14 May 2007 Paper

Aspheric lens tester with shack-hartmann sensor

A. Ruprecht, I. Scheele, S. Krey, J. Heinisch

Proceedings Volume 10316, 103160W (2007) https://doi.org/10.1117/12.719736

KEYWORDS: Point spread functions, Microlens array, Imaging systems, Cameras, Sensors, Wavefront sensors, Wavefronts, Image sensors, Aspheric lenses, Modulation transfer functions

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Proceedings Article | 14 May 2007 Paper

Measurement of aspheric surfaces with 3D-deflectometry

I. Scheele, S. Krey, J. Heinisch

Proceedings Volume 10316, 103160P (2007) https://doi.org/10.1117/12.719713

KEYWORDS: Beam splitters, Optical spheres, Sensors, Metals, Interferometry, Head, Time metrology, Optical resolution, Aspheric lenses, Spherical lenses

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Showing 5 of 7 publications

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