Dr. James R. Pekelsky
at National Research Council Canada
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 29 January 2007 Paper
J.-Angelo Beraldin, Marc Rioux, Luc Cournoyer, Francois Blais, Michel Picard, Jim Pekelsky
Proceedings Volume 6491, 64910B (2007) https://doi.org/10.1117/12.698381
KEYWORDS: 3D metrology, Imaging systems, 3D modeling, Stereoscopy, 3D image processing, Laser scanners, 3D scanning, Standards development, 3D imaging standards, Metrology

Proceedings Article | 18 August 2005 Paper
James Pekelsky, Lorne Munro
Proceedings Volume 5879, 58790D (2005) https://doi.org/10.1117/12.618611
KEYWORDS: Calibration, Autocollimators, Information technology, Interferometers, Mirrors, Metrology, Data modeling, Prisms, Medium wave, Uncertainty analysis

Proceedings Article | 22 October 2001 Paper
Jennifer Decker, Anthony Ulrich, Alain LaPointe, Miguel Viliesid, James Pekelsky
Proceedings Volume 4401, (2001) https://doi.org/10.1117/12.445628
KEYWORDS: Calibration, Ceramics, Temperature metrology, Interferometry, Optical calibration, Optical interferometry, Silica, Metrology, Manufacturing, Interferometers

Proceedings Article | 30 September 1998 Paper
Jennifer Decker, Anthony Ulrich, James Pekelsky
Proceedings Volume 3477, (1998) https://doi.org/10.1117/12.323113
KEYWORDS: Calibration, Standards development, Temperature metrology, Tungsten, Thermal effects, Interferometry, Transducers, Chromium, Mathematical modeling, Optical interferometry

Conference Committee Involvement (2)
Recent Developments in Traceable Dimensional Measurements III
31 July 2005 | San Diego, California, United States
Recent Developments in Traceable Dimensional Measurements II
4 August 2003 | San Diego, California, United States
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