Dr. Jeffrey W. Carr
CTO at RAPT Industries Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 April 2002 Paper
Lawrence Hrubesh, Mary Norton, William Molander, Eugene Donohue, Stephen Maricle, Bernie Penetrante, Raymond Brusasco, Walter Grundler, Jim Butler, Jeff Carr, R. Hill, Leslie Summers, Michael Feit, Alexander Rubenchik, Michael Key, Paul Wegner, Alan Burnham, Lloyd Hackel, Mark Kozlowski
Proceedings Volume 4679, (2002) https://doi.org/10.1117/12.461723
KEYWORDS: Silica, Carbon dioxide lasers, Etching, National Ignition Facility, Laser induced damage, Plasma, Carbon dioxide, Wet etching, Fluorine, Contamination

Proceedings Article | 20 April 1998 Paper
Mark Kozlowski, Jeff Carr, Ian Hutcheon, Richard Torres, Lynn Sheehan, David Camp, Ming Yan
Proceedings Volume 3244, (1998) https://doi.org/10.1117/12.307031
KEYWORDS: Surface finishing, Polishing, Silica, Contamination, Aluminum, Profiling, Laser induced damage, Laser optics, UV optics, Ions

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