Jeffrey M. Knecht
Sr. Assistant Staff at MIT Lincoln Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2008 Paper
Jeffrey Knecht, Vladimir Bolkhovsky, Jay Sage, Brian Tyrrell, Bruce Wheeler, Charles Wynn
Proceedings Volume 6924, 69244R (2008) https://doi.org/10.1117/12.777133
KEYWORDS: Charge-coupled devices, Photomasks, Phase shifts, Signal processing, Lithography, Etching, CMOS technology, Critical dimension metrology, Double patterning technology, Photoresist materials

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