Mr. Jeffrey T. Meier Profile

Jeffrey T. Meier

Electro Optical Engineer at US Army Redstone Test Ctr

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Publications (4)

SPIE Journal Paper | 26 October 2024

Techniques for measuring comparable lab and field modulation transfer functions

Jordan Rubis, Patrick Leslie, Jeffrey Meier, Eddie Jacobs, Ronald Driggers

OE, Vol. 63, Issue 10, 104105, (October 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.10.104105

KEYWORDS: Modulation transfer functions, Sensors, Light sources and illumination, Short wave infrared radiation, Emissivity, Collimators, Reflection, Long wavelength infrared, Imaging systems, Real-time computing

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Proceedings Article | 7 June 2024 Presentation + Paper

Techniques for measuring comparable lab and field MTFs

Jordan Rubis, Patrick Leslie, Jeffery Meier, Ellie Spitzer, Eddie Jacobs, Ron Driggers

Proceedings Volume 13045, 1304510 (2024) https://doi.org/10.1117/12.3013803

KEYWORDS: Modulation transfer functions, Sensors, Light sources and illumination, Long wavelength infrared, Sunlight, Sun, Short wave infrared radiation, Collimators

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SPIE Journal Paper | 28 October 2020

Measuring the infrared intensity of a close-up resolved target with close-up blackbody references

Jeff Meier, Kenny N. M. Emmanuel, Zach Whitfield, Matthew Hester, Patrick O'Shea, Ronald Driggers, Carl Halford, Orges Furxhi

OE, Vol. 59, Issue 10, 103108, (October 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.10.103108

KEYWORDS: Black bodies, Sensors, Calibration, Radiometry, Infrared radiation, Target detection, Nonuniformity corrections, Infrared sensors, Infrared search and track, Signal to noise ratio

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The intensity of objects in the infrared is an important quantity for a number of applications. Intensity in watts per steradian is the parameter that is used to describe either small targets or targets that are far away. Intensity is used because these cases are usually presented to a detection sensor where the object is smaller than the sensor detector angular subtense, a situation known as an “unresolved target.” In the military, unresolved targets can be rocket-propelled grenades, man-portable air defense threats, enemy aircraft at long range, or even ground vehicles that are being engaged by ground-to-ground or air-to-ground missiles. Typical “resolved target” metrics such as root-sum-squared differential temperature do not work well for unresolved targets. In addition, a given target intensity coupled with range, atmospheric transmission, and sensor noise equivalent irradiance can provide a quick signal-to-noise estimate of a particular sensor against a particular target. Target intensity can even be a measure of how visible ones platform is to other sensor and can be used to reduce platform signatures. Measurement of intensity is always a difficult procedure, where there is typically a sensor that does not encompass all aspects of measurement parameters. For example, there are very few radiometers that include high-resolution spatial measurements with high-resolution spectral measurements with high-resolution temporal measurements, not to mention polarization. For the few systems that exist that can provide a simultaneous measurement with most of these parameters, the cost is prohibitive. Usually, a spectral radiometer will provide high spectral resolution with no spatial information and a slow temporal rate. These measurements are common. In the case we describe here, the intensity measurement is taken broadband in the midwave or longwave infrared regions with good spatial resolution. This measurement provides a band integrated intensity measurement. We describe an approach for sensor calibration and object intensity measurement that can be used for broadband sensors applications.

Proceedings Article | 25 October 1999 Paper

Diffractive optical element for Stokes vector measurement with a focal plane array

Gregory Nordin, Jeffrey Meier, Panfilo Deguzman, Michael Jones

Proceedings Volume 3754, (1999) https://doi.org/10.1117/12.366355

KEYWORDS: Polarization, Polarizers, Diffractive optical elements, Staring arrays, Chromium, Image filtering, Optical filters, Molybdenum, Imaging systems, Silicon

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