Dr. Jiao Bai Profile

Dr. Jiao Bai

at China Academy of Engineering

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 20 November 2024 Poster + Paper

Film thickness measurement by fitting extreme points of the normal spectral reflectance

Jiao Bai, Huaming Chen, Junguang Chen, Haowei Yang

Proceedings Volume 13241, 132411D (2024) https://doi.org/10.1117/12.3034873

KEYWORDS: Film thickness, Reflectivity, Refractive index, Reflection, Reflectance spectroscopy, Spectroscopy, Genetic algorithms

Read Abstract +

Proceedings Article | 27 November 2023 Poster + Paper

Thin-film thickness measurement with normal spectral reflectance

Jiao Bai, Haowei Yang, Junguang Chen, Yinke Liu, Jiangfeng Song, Yan Shi

Proceedings Volume 12771, 1277117 (2023) https://doi.org/10.1117/12.2684208

KEYWORDS: Film thickness, Reflectivity, Reflection, Thin films, Objectives, Silica, Genetic algorithms, Spectroscopy, Refractive index, Incident light

Read Abstract +

Proceedings Article | 21 December 2022 Poster + Paper

Fabrication of a micro lens array-grating for a miniature spectrometer

Shuonan Shan, Peiyuan Liu, Jingwen Li, Jiao Bai, Xiaohao Wang, Xinghui Li

Proceedings Volume 12315, 123151L (2022) https://doi.org/10.1117/12.2644104

KEYWORDS: Microlens, Spectroscopy, Microlens array, Diffraction gratings, Chemical elements, Image resolution, Optical design, Objectives, Lithography, Fluorine, Spectrometers

Read Abstract +

Proceedings Article | 9 October 2021 Poster + Paper

High precision roundness measurement with two chromatic confocal sensors

Yingzuo Wang, Jiao Bai, Guangyao Huang, Qian Zhou, Xiaohao Wang, Xinghui Li

Proceedings Volume 11899, 1189915 (2021) https://doi.org/10.1117/12.2602211

KEYWORDS: Sensors, Colorimetry, Confocal microscopy, Lithium, Nickel, Error analysis, Spindles, Precision measurement, Manufacturing, Spectroscopy

Read Abstract +

Proceedings Article | 9 October 2021 Paper

A modified chromatic confocal system for spectral reflectance measurement

Jiao Bai, Jingwen Li, Gaopeng Xue, Xiaohao Wang, Qian Zhou, Xinghui Li

Proceedings Volume 11895, 1189508 (2021) https://doi.org/10.1117/12.2602209

KEYWORDS: Reflectivity, Confocal microscopy, Colorimetry, Mirrors, Aluminum, Reflection, Spectroscopy, Light sources, Sensors, Metals

Read Abstract +

Proceedings Article | 9 October 2021 Poster + Paper

Film thickness measurement by double-wavelength infrared transmittance method

Jingwen Li, Zhen Hua, Jiao Bai, Qian Zhou, Xiaohao Wang, Kai Ni, Xinghui Li

Proceedings Volume 11899, 118990X (2021) https://doi.org/10.1117/12.2601188

KEYWORDS: Transmittance, Infrared radiation, Sensors, Light sources, Reflectivity, Optical filters, Beam splitters, Light, Lithium, Reflection

Read Abstract +

Proceedings Article | 7 March 2019 Paper

Design and testing of a chromatic dispersion system for displacement application by using a spatial-bandpass-filter

Jiao Bai, Xiaohao Wang, Xinghui Li, Qian Zhou, Kai Ni

Proceedings Volume 11053, 110533I (2019) https://doi.org/10.1117/12.2512172

KEYWORDS: Dispersion, Monochromatic aberrations, Confocal microscopy, Colorimetry, Spectroscopy, Zemax, Signal to noise ratio, Light sources, Aspheric lenses, Spatial resolution

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years