Semiconductor laser is partially coherent beam, while the beam quality factor is based on fully coherent beam. The Wigner distribution function for partially coherent beam is used to analyze the semiconductor laser beam. The Wigner distribution function contains both spatial information and spatial frequency information in the phase space. A method for measuring the Wigner distribution function of semiconductor laser is reported. The intensity distribution of the beam caustics is measured by two focusing mirrors, and the Wigner distribution function of semiconductor laser is reconstructed. Based on the reconstructed Wigner distribution function, the light intensity of semiconductor laser is simulated. The simulated data are in good agreement with the experimental data. Through the properties of Wigner distribution function, the wavefront aberration and coherence of semiconductor laser are analyzed. The wavefront of semiconductor laser is symmetrically distributed around a point, and the wavefront on the left side of the laser diode array is larger than that on the right side. Due to the temperature difference of the laser chip, the coherence on both sides of the laser diode array is better than that in the middle of the laser diode array.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.