JinHan Na
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 November 2020 Paper
Proceedings Volume 11567, 1156724 (2020) https://doi.org/10.1117/12.2579775
KEYWORDS: Principal component analysis, Remote sensing, Hyperspectral imaging, Spectral models, Spatial resolution, Image classification, Feature extraction, Error analysis, Dimension reduction

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