Dr. Joanna Schmit Profile

Dr. Joanna Schmit

Optical Engineer at 4D Technology Corp

SPIE Involvement:

Awards Committee | Conference Program Committee | Author | Editor

Publications (30)

Proceedings Article | 9 September 2021 Open Access

Seeing fringes everywhere: impact of James C. Wyant's contributions to optical metrology

Katherine Creath, Joanna Schmit, Goldie Goldstein

Proceedings Volume 11813, 1181308 (2021) https://doi.org/10.1117/12.2569459

KEYWORDS: Interferometers, Interferometry, Phase shifts, Optical metrology, Phase interferometry, Optical testing, Holography, Fringe analysis, Computer generated holography, Microscopes

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 7 September 2018 Paper

Inspection of mechanical surfaces with polarized structured light

Joanna Schmit, Erik Novak, Shawn McDermed

Proceedings Volume 10834, 108342F (2018) https://doi.org/10.1117/12.2322178

KEYWORDS: Structured light, Inspection, 3D metrology, Fringe analysis, Polarization, Interferometry

Read Abstract +

Proceedings Article | 1 September 2015 Paper

3D interferometric microscope: color visualization of engineered surfaces for industrial applications

Joanna Schmit, Matt Novak, Son Bui

Proceedings Volume 9576, 957607 (2015) https://doi.org/10.1117/12.2190352

KEYWORDS: Interferometry, 3D metrology, Objectives, Microscopes, 3D image processing, Image processing, RGB color model, Mirrors, Cameras, Visualization

Read Abstract +

Proceedings Article | 13 November 2014 Paper

Real-time scanner error correction in white light interferometry

Dong Chen, Joanna Schmit, Matt Novak

Proceedings Volume 9276, 92760I (2014) https://doi.org/10.1117/12.2071276

KEYWORDS: Scanners, Error analysis, Demodulation, Mirrors, 3D metrology, 3D scanning, Optical interferometry, Interferometers, Microscopes, Spherical lenses

Read Abstract +

SPIE Journal Paper | 17 September 2014 Open Access

Special Section Guest Editorial: Optical Fabrication, Testing, and Metrology

Daniel Malacara-Hernández, Joanna Schmit, Sven Schröder

OE, Vol. 53, Issue 09, 092001, (September 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.9.092001

KEYWORDS: Optical fabrication, Optical testing, Optics manufacturing, Metrology, Optical engineering, Optical components, Surface finishing, Precision optics, Thin films, Magnetorheological finishing

DOWNLOAD PAPER

Proceedings Article | 28 May 2014 Paper

Metrology tool for fast measurement of patterned sapphire substrate used in LED manufacturing

Joanna Schmit, Son Bui, Oh-Kyu Kwon, Dong Chen

Proceedings Volume 9110, 91100N (2014) https://doi.org/10.1117/12.2053485

KEYWORDS: 3D metrology, Light emitting diodes, Mirrors, Objectives, Microscopes, Metrology, Sapphire, Manufacturing, Interferometry, Temperature metrology

Read Abstract +

Proceedings Article | 15 October 2012 Paper

William L. Wolfe, 1989 President of SPIE, encourages scientists from Eastern Europe

Joanna Schmit

Proceedings Volume 8483, 84830B (2012) https://doi.org/10.1117/12.958602

KEYWORDS: Polishing, Radiometry, Visible radiation, Infrared radiation, Iron, Curtains, Radio optics, Optical testing, Roads, Laser applications

Read Abstract +

Proceedings Article | 17 June 2009 Paper

Ball bearing measurement with white light interferometry

Joanna Schmit, Sen Han, Erik Novak

Proceedings Volume 7389, 73890P (2009) https://doi.org/10.1117/12.828113

KEYWORDS: Gaussian filters, Surface roughness, Surface finishing, 3D metrology, Ceramics, Microscopes, Optical interferometry, Metrology, Optical testing, Standards development

Read Abstract +

Proceedings Article | 11 August 2008 Paper

Iterative algorithm for phase shifting interferometry with finite bandwidth illumination

Florin Munteanu, Joanna Schmit

Proceedings Volume 7063, 70630L (2008) https://doi.org/10.1117/12.797473

KEYWORDS: Phase measurement, Phase interferometry, Interferometry, Iterative methods, Light sources, Mirrors, Scanners, Algorithm development, Optical filters, Cameras

Read Abstract +

SPIE Journal Paper | 1 July 2007

Improved polarization Mirau interference microscope

Joanna Schmit, Parameswaran Hariharan

OE, Vol. 46, Issue 07, 077007, (July 2007) https://doi.org/10.1117/12.10.1117/1.2751166

KEYWORDS: Microscopes, Phase shifts, Polarization, Beam splitters, Interferometers, Mirau interferometers, Visibility, Optical engineering, Phase shifting, Linear polarizers

Read Abstract +

SPIE Journal Paper | 1 November 2006

Two-wavelength interferometric profilometry with a phase-step error-compensating algorithm

Joanna Schmit, Parameswaran Hariharan

OE, Vol. 45, Issue 11, 115602, (November 2006) https://doi.org/10.1117/12.10.1117/1.2387882

KEYWORDS: Interferometry, Algorithm development, Phase measurement, Tolerancing, Phase shifts, Detection and tracking algorithms, Mirau interferometers, Ferroelectric materials, 3D displays, Optical engineering

Read Abstract +

Proceedings Article | 14 August 2006 Paper

Thickness-profile measurement of transparent thin-film layers by spectrally resolved phase-shifting interferometry

Sanjit Debnath, Mahendra Kothiyal, Joanna Schmit, Parameswaran Hariharan

Proceedings Volume 6292, 629214 (2006) https://doi.org/10.1117/12.679484

KEYWORDS: Thin films, Phase shifts, Phase interferometry, Phase measurement, Refractive index, Ferroelectric materials, Interferometry, Phase shifting, Silicon, Spectroscopy

Read Abstract +

Proceedings Article | 14 August 2006 Paper

Applications of imaging interferometry

Jason Reed, Paul Wilkinson, Keith O'Doherty, Joanna Schmit, Sen Han, Josh Troke, Michael Teitell, William Klug, James Gimzewski

Proceedings Volume 6293, 629301 (2006) https://doi.org/10.1117/12.683948

KEYWORDS: Interferometry, Metrology, Imaging systems, Live cell imaging, Microscopy, Diagnostics, Mode conditioning cables, Mirrors, Profiling, Silicon

Read Abstract +

Proceedings Article | 20 October 2005 Paper

Limitations of iterative least squares methods in phase shifting interferometry in presence of vibrations

Joanna Schmit, Florin Munteanu

Proceedings Volume 5965, 59650Z (2005) https://doi.org/10.1117/12.627764

KEYWORDS: Radium, Phase shifts, Phase interferometry, Modulation, Mirrors, Scanners, Phase shift keying, Phase measurement, Cameras, Error analysis

Read Abstract +

Proceedings Article | 2 August 2004 Paper

Fringe spacing in white-light interferometry

Joanna Schmit, Paul Unruh, Der-Shen Wan

Proceedings Volume 5531, (2004) https://doi.org/10.1117/12.563911

KEYWORDS: Objectives, Mirrors, Microscopes, Distance measurement, Interferometry, Calibration, Interferometers, Bandpass filters, Motion measurement, Fringe analysis

Read Abstract +

Proceedings Article | 22 December 2003 Paper

Calibration of high-speed optical profiler

Joanna Schmit, Michael Krell, Erik Novak

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.504930

KEYWORDS: Calibration, Scanners, Interferometers, Interferometry, Optical calibration, Signal detection, Motion measurement, Objectives, Standards development, Optical filters

Read Abstract +

Proceedings Article | 20 November 2003 Paper

Improved shape measurement in optical profiler

Joanna Schmit, Erik Novak

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.506946

KEYWORDS: Scanners, Calibration, Interferometry, Signal detection, Standards development, Motion measurement, Helium neon lasers, Optical testing, Objectives, Interferometers

Read Abstract +

Proceedings Article | 30 May 2003 Paper

High-speed measurements using optical profiler

Joanna Schmit

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.501035

KEYWORDS: Scanners, Cameras, Modulation, Signal detection, Calibration, Phase shift keying, Optical testing, Interferometers, Phase shifts, Interference (communication)

Read Abstract +

SPIE Journal Paper | 1 January 2003

High-stability white-light interferometry with reference signal for real-time correction of scanning errors

Artur Olszak, Joanna Schmit

OE, Vol. 42, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1523942

KEYWORDS: Scanners, Interferometers, Signal detection, Interferometry, Light sources, Calibration, Sensors, Beam splitters, Motion measurement, Cameras

Proceedings Article | 20 June 2002 Paper

Challenges in white-light phase-shifting interferometry

Joanna Schmit, Artur Olszak

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472211

KEYWORDS: Scanners, Interferometry, Phase interferometry, Phase measurement, Phase shifting, Interferometers, Fringe analysis, Coherence (optics), Optical interferometry, Microscopes

Read Abstract +

Proceedings Article | 20 June 2002 Paper

White-light interferometry with reference signal

Joanna Schmit, Artur Olszak, Shawn McDermed

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472209

KEYWORDS: Scanners, Interferometers, Interferometry, Sensors, Signal detection, Motion measurement, Signal processing, Beam splitters, Light sources, Optical interferometry

Read Abstract +

Proceedings Article | 5 June 2001 Paper

High-precision interferometric shape measurement of objects with areas of different reflectance

Joanna Schmit, Akiko Harasaki

Proceedings Volume 4275, (2001) https://doi.org/10.1117/12.429351

KEYWORDS: Reflectivity, Glasses, Silver, Interferometry, Optical filters, Signal to noise ratio, Cameras, Microscopes, Mirrors, Phase shifts

Read Abstract +

Proceedings Article | 13 August 1999 Paper

Two-wavelength interferometry combined with N-point technique

Joanna Schmidt

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357713

Read Abstract +

SPIE Journal Paper | 1 August 1997

Simultaneous registration of in- and out-of-plane displacements in modified grating interferometry

Joanna Schmit, Krzysztof Patorski, Katherine Creath

OE, Vol. 36, Issue 08, (August 1997) https://doi.org/10.1117/12.10.1117/1.601446

KEYWORDS: Polarization, Diffraction, Diffraction gratings, Interferometers, Beam splitters, Cameras, Interferometry, Mirrors, Image registration, Prisms

Proceedings Article | 18 September 1996 Paper

Computerized interferometric measurement of surface microstructure

James Wyant, Joanna Schmit

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250754

KEYWORDS: Microscopes, Phase shifts, Interferometry, Electronics, Computing systems, Phase interferometry, Phase measurement

Read Abstract +

Proceedings Article | 14 June 1995 Paper

Fast calculation of phase in spatial n-point phase-shifting techniques

Joanna Schmit, Katherine Creath

Proceedings Volume 2544, (1995) https://doi.org/10.1117/12.211855

KEYWORDS: Phase shifts, Phase measurement, Detection and tracking algorithms, Fringe analysis, Linear filtering, Algorithm development, CCD cameras, Phase shift keying, Gallium, Moire patterns

Read Abstract +

Proceedings Article | 12 December 1994 Paper

Errors in spatial phase-stepping techniques

Katherine Creath, Joanna Schmit

Proceedings Volume 2340, (1994) https://doi.org/10.1117/12.195908

KEYWORDS: Phase shifts, Sensors, Phase measurement, Error analysis, Detection and tracking algorithms, Data processing, Wavefronts, Scanning probe microscopy, Chlorine, Phase interferometry

Read Abstract +

Proceedings Article | 5 February 1993 Paper

Spatial and temporal phase-measurement techniques: a comparison of major error sources in one dimension

Joanna Schmit, Katherine Creath, Malgorzata Kujawinska

Proceedings Volume 1755, (1993) https://doi.org/10.1117/12.140770

KEYWORDS: Sensors, Phase shifts, Error analysis, Scanning probe microscopy, Fourier transforms, Interferometry, Phase measurement, Fringe analysis, Chlorine, Calcium

Read Abstract +

Proceedings Article | 1 October 1991 Paper

Spatial-carrier phase-shifting technique of fringe pattern analysis

Malgorzata Kujawinska, Joanna Wojciak

Proceedings Volume 1508, (1991) https://doi.org/10.1117/12.47089

KEYWORDS: Fringe analysis, Phase shifting, Phase shifts, Fourier transforms, Error analysis, Deflectometry, Holography, Speckle, Digital filtering, Wavefront sensors

Read Abstract +

Proceedings Article | 1 August 1991 Paper

Testing of PZT shifters for interferometric measurements

Joanna Schmit, Tadeusz Piatkowski

Proceedings Volume 1391, (1991) https://doi.org/10.1117/12.57157

KEYWORDS: Ferroelectric materials, Interferometry, Fizeau interferometers, Mirrors, Fourier transforms, Phase measurement, Sagnac interferometers, Calibration, Fringe analysis, Laser applications

Read Abstract +

Showing 5 of 30 publications

Proceedings Volume Editor (7)

SPIE Conference Volume | 18 July 2014

Interferometry XVII: Techniques and Analysis

SPIE Conference Volume | 16 July 2012

Interferometry XVI: Techniques and Analysis

SPIE Conference Volume | 2 August 2010

Interferometry XV: Techniques and Analysis

SPIE Conference Volume | 10 August 2008

Interferometry XIV: Techniques and Analysis

SPIE Conference Volume | 13 August 2006

Interferometry XIII: Techniques and Analysis

Showing 5 of 7 publications

Conference Committee Involvement (28)

Interferometry and Structured Light 2024

21 August 2024 | San Diego, California, United States

Interferometry XXI

24 August 2022 | San Diego, California, United States

Interferometry XX

24 August 2020 | Online Only, California, United States

Interferometry XIX

21 August 2018 | San Diego, California, United States

Optical Manufacturing and Testing XII

20 August 2018 | San Diego, California, United States

Interferometry XVIII

30 August 2016 | San Diego, California, United States

Optical Manufacturing and Testing XI

9 August 2015 | San Diego, California, United States

Interferometry XVII: Techniques and Analysis

17 August 2014 | San Diego, California, United States

Optical Manufacturing and Testing X

26 August 2013 | San Diego, California, United States

Interferometry XVI: Techniques and Analysis

13 August 2012 | San Diego, California, United States

Optical Fabrication, Testing, and Metrology IV

7 September 2011 | Marseille, France

Optical Manufacturing and Testing IX

22 August 2011 | San Diego, California, United States

Interferometry XV: Techniques and Analysis

2 August 2010 | San Diego, California, United States

Optical Manufacturing and Testing VIII

4 August 2009 | San Diego, California, United States

Optical Fabrication, Testing, and Metrology III

2 September 2008 | Glasgow, Scotland, United Kingdom

Interferometry XIV: Techniques and Analysis

11 August 2008 | San Diego, California, United States

Optical Manufacturing and Testing VII

28 August 2007 | San Diego, California, United States

Interferometry XIII: Applications

16 August 2006 | San Diego, California, United States

Interferometry XIII: Techniques and Analysis

14 August 2006 | San Diego, California, United States

Optical Fabrication, Testing, and Metrology II

13 September 2005 | Jena, Germany

Lasers and Applications

30 August 2005 | Warsaw, Poland

Optical Manufacturing and Testing VI

31 July 2005 | San Diego, California, United States

Interferometry XII: Applications

4 August 2004 | Denver, Colorado, United States

Interferometry XII: Techniques and Analysis

2 August 2004 | Denver, Colorado, United States

Optical Manufacturing and Testing V

3 August 2003 | San Diego, California, United States

Interferometry XI: Techniques and Analysis

8 July 2002 | Seattle, WA, United States

Precision Optical Measurements

18 September 2001 | Tucson, AZ, United States

Laser Interferometry X: Techniques and Analysis

31 July 2000 | San Diego, CA, United States

Showing 5 of 28 Conference Committees

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years