Dr. Johannes Stadtmüller
at Technische Hochschule Aschaffenburg
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 April 2021 Presentation + Paper
Proceedings Volume 11776, 1177607 (2021) https://doi.org/10.1117/12.2592551
KEYWORDS: Mirrors, X-rays, X-ray characterization, Reflectivity, X-ray telescopes, Iridium, X-ray optics, Optical coatings, Chromium, Transmission electron microscopy

Proceedings Article | 18 April 2021 Presentation + Paper
Proceedings Volume 11776, 1177605 (2021) https://doi.org/10.1117/12.2589266
KEYWORDS: X-ray telescopes, Mirrors, Eye, Telescopes, Reflectivity, Chromium, Iridium, Transmission electron microscopy, Silicon, Semiconductors

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